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Gopalakrishnan, Ramaswami

rp02284

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Full Name
Gopalakrishnan, Ramaswami
Variants
Gopalakrishnan, R.
 
Main Affiliation
 
Faculty
 

Publications

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Department:  INSTITUTE OF MICROELECTRONICS

Results 1-11 of 11 (Search time: 0.004 seconds).

Issue DateTitleAuthor(s)
115-Nov-1994An experimental study of die attach polymer bleedout in ceramic packagesMarks, M.R. ; Thompson, J.A. ; Gopalakrishnan, R. 
22000Application of excimer laser annealing in the formation of ultra-shallow p+/n junctionsChong, Y.F.; Pey, K.L. ; Wee, A.T.S. ; See, A. ; Tung, C.-H. ; Gopalakrishnan, R. ; Lu, Y.F. 
3Feb-1995Catalysis by manganese oxide monolayers part 1: alumina and magnesia supportsMa, J.; Chuah, G.K. ; Jaenicke, S. ; Gopalakrishnan, R. ; Tan, K.L. 
4Mar-1995Characterization of xF2:(1 - x)AgPO3 and xAgF:(1 - x)AgPO3 glassesChowdari, B.V.R. ; Mok, K.F. ; Xie, J.M.; Gopalakrishnan, R. 
51996Double heterostructure laser diode emitting at 1·06 μm using quaternary alloy of InGaAlAsChua, S.J. ; Ramam, A. ; Lim, N. ; Gopalakrishnan, R. ; Tan, K.L. 
6Mar-1995Electrical and structural studies of lithium fluorophosphate glassesChowdari, B.V.R. ; Mok, K.F. ; Xie, J.M.; Gopalakrishnan, R. 
7Feb-1995Investigation of the ferroelectric phase transition in (CH3NH3)HgCl3Jiang, Z.T.; James, B.D.; Liesegang, J.; Tan, K.L. ; Gopalakrishnan, R. ; Novak, I. 
8Dec-2001Laser-induced titanium disilicide formation for submicron technologiesChong, Y.F.; Pey, K.L. ; Wee, A.T.S. ; See, A. ; Shen, Z.X. ; Tung, C.-H. ; Gopalakrishnan, R. ; Lu, Y.F. 
91995Structural properties of amorphous silicon carbide films by plasma-enhanced chemical vapor depositionChoi, W.K. ; Chan, Y.M.; Ling, C.H. ; Lee, Y.; Gopalakrishnan, R. ; Tan, K.L. 
101995Surface analysis and application in magnetic hard disk mediaGopalakrishnan, R. 
1115-May-1995Surface and electrical studies of CuO:V2O5 thin filmsGopalakrishnan, R. ; Chowdari, B.V.R. ; Tan, K.L. ; Radhakrishnan, K.