Surface analysis and application in magnetic hard disk media

Abstract

Surface Techniques (XPS, AES and SIMS) are gaining popularity in recent years as an indispensable analytical tool in providing synergistic approach to solve technological problems. To illustrate the capabilities and limitations of these techniques, a wide number of practical examples in the area of magnetic disk media are presented and discussed. These examples include: measurement of loop thickness, composition of magnetic thin films, nature and quality of interface, impurity and contamination studies at micro/macroscopic regions, failure analysis etc.