1. ScholarBank@NUS

Weng Khuen Ho

rp01547

Collaboration Map View Statistics Email Alert RSS Feed

Profile

Full Name
Weng Khuen Ho
Variants
Ho, W.-K.
Ho, Weng-Khuen
Khuen, Ho Weng
Ho, M.
Ho, Weng Khuen
Khuen Ho, W.
Ho, W.Y.
Khuen, H.W.
Ho, W.K.
 
Main Affiliation
 
Faculty
 
Email
elehowk@nus.edu.sg
 

Publications

Refined By:
Author:  Ho, W.K.
Department:  COLLEGE OF DESIGN AND ENGINEERING
Type:  Article

Results 1-20 of 72 (Search time: 0.007 seconds).

Issue DateTitleAuthor(s)
1Jul-1994A comparison of two design methods for PID controllersHang, C.C. ; Ho, W.K. ; Cao, L.S.
2Feb-2007A multiobjective memetic algorithm based on particle swarm optimizationLiu, D.; Tan, K.C. ; Goh, C.K.; Ho, W.K. 
3Jul-1996A novel relay auto-tuning technique for processes with integrationHo, W.K. ; Feng, E.B. ; Gan, O.P.
42004A Robust Strategy for Joint Data Reconciliation and Parameter EstimationJoe, Y.Y.; Wang, D.; Ching, C.B.; Tay, A. ; Ho, W.K. ; Romagnoli, J.
5Feb-2007An in situ approach to real-time spatial control of steady-state wafer temperature during thermal processing in microlithographyTay, A. ; Ho, W.K. ; Hu, N.
6Aug-1993Automatic tuning and adaptation for PID controllers - a surveyÅström, K.J.; Hägglund, T.; Hang, C.C. ; Ho, W.K. 
7Feb-2005Characterizing photolithographic linewidth sensitivity to process temperature variations for advanced resists using a thermal arraySchaper, C.D.; El-Awady, K.; Kailath, T.; Tay, A. ; Lee, L.L.; Ho, W.K. ; Fuller, S.E.
8Feb-2004Constraint feedforward control for thermal processing of quartz photomasks in microelectronics manufacturingTay, A. ; Ho, W.K. ; Schaper, C.D.; Lee, L.L.
9Feb-2005Context-based recognition of process states using neural networksSrinivasan, R. ; Wang, C.; Ho, W.K. ; Lim, K.W. 
1015-Jan-2006Control of photoresist film thickness: Iterative feedback tuning approachTay, A. ; Khuen Ho, W. ; Deng, J.; Keng Lok, B.
1119-Apr-2018Coordinate control of air movement for optimal thermal comfortShuo LIU; LE YIN; Stefano Schiavon; Weng Khuen Ho ; Ling Keck Voon
12Dec-2008Critical dimension and real-time temperature control for warped wafersHo, W.K. ; Tay, A. ; Fu, J. ; Chen, M.; Feng, Y.
13Nov-2007Critical dimension uniformity via real-time photoresist thickness controlHo, W.K. ; Tay, A. ; Chen, M.; Fu, J. ; Lu, H.; Shan, X.
1428-Apr-2004Dynamic Principal Component Analysis Based Methodology for Clustering Process States in Agile Chemical PlantsSrinivasan, R. ; Wang, C.; Ho, W.K. ; Lim, K.W. 
15Jul-2005Estimation of wafer warpage profile during thermal processing in microlithographyTay, A. ; Ho, W.K. ; Hu, N.; Chen, X.
1630-Apr-2014Filtering of the ARMAX process with generalized t -distribution noise: The influence function approachHo, W.K. ; Ling, K.V.; Vu, H.D.; Wang, X.
17Jun-1996Frequency domain approach to self-tuning PID controlHo, W.K. ; Hang, C.C. ; Wojsznis, W.; Tao, Q.H. 
18Jun-1996Frequency domain approach to self-tuning PID controlHo, W.K. ; Hang, C.C. ; Wojsznis, W.; Tao, Q.H. 
192019Full coverage of optimal phasor measurement unit placement solutions in distribution systems using integer linear programmingChen, X.; Sun, L.; Chen, T.; Sun, Y.; Rusli; Tseng, K.J.; Ling, K.V.; Ho, W.K. ; Amaratunga, G.A.J.
201-Feb-1998Gain-scheduling control of the Switched Reluctance MotorHo, W.K. ; Panda, S.K. ; Lim, K.W. ; Huang, F.S.