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Tan Kuang Lee

rp05492

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Full Name
Tan Kuang Lee
(not current staff)
Variants
TAN, KUANG LEE
TAN, KUANG L.
Lee Tan, K.
Tan, K.L.
Kuang Lee Tan
Tan, K.-L.
 
Main Affiliation
 
Faculty
 
Email
phytankl@nus.edu.sg
 

Publications

Refined By:
Author:  Tan, K.L.
Author:  Wee, A.T.S.

Results 1-20 of 31 (Search time: 0.005 seconds).

Issue DateTitleAuthor(s)
1Jan-1994A comparative study of the initial oxygen and water reactions on germanium and silicon using simsWee, A.T.S. ; Huan, C.H.A. ; Thong, P.S.P.; Tan, K.L. 
21997A microstructural study on the surface and interface of CdTe/CdS solar cellsLi, K.; Wee, A.T.S. ; Lin, J. ; Tan, K.L. ; Zhou, L. ; Li, S.F.Y. ; Feng, Z.C.; Chou, H.C.; Kamra, S.; Rohatgi, A.
320-Jun-1997A surface and interface study on the InSb/GaAs heterostructuresLi, K.; Wee, A.T.S. ; Lin, J. ; Lee, K.K.; Watt, F. ; Tan, K.L. ; Feng, Z.C.; Webb, J.B.
41-Jun-1997AES analysis of nitridation of Si(100) by 2-10 keV N+ 2 ion beamsPan, J.S. ; Wee, A.T.S. ; Huan, C.H.A. ; Tan, H.S. ; Tan, K.L. 
5Dec-1996AES analysis of silicon nitride formation by 10 keV N+ and N+ 2 ion implantationPan, J.S. ; Wee, A.T.S. ; Huan, C.H.A. ; Tan, H.S. ; Tan, K.L. 
61-Dec-1995An alternative method for determining the transmission function of secondary ion mass spectrometersLow, M.H.S.; Huan, C.H.A. ; Wee, A.T.S. ; Tan, K.L. 
7Jan-1994An investigation of the Ar+ ion-enhanced reaction of CCl4 on Si(100) by secondary ion mass spectrometryWee, A.T.S. ; Huan, C.H.A. ; Tan, K.L. ; Tan, R.S.K.
815-Mar-1996Argon incorporation and silicon carbide formation during low energy argon-ion bombardment of Si(100)Pan, J.S. ; Wee, A.T.S. ; Huan, C.H.A. ; Tan, H.S. ; Tan, K.L. 
915-Dec-1996Argon incorporation and surface compositional changes in InP(100) due to low-energy Ar+ ion bombardmentPan, J.S. ; Wee, A.T.S. ; Huan, C.H.A. ; Tan, H.S. ; Tan, K.L. 
1021-Sep-1997ARXPS analysis of surface compositional change in Ar+ ion bombarded GaAs (100)Pan, J.S. ; Wee, A.T.S. ; Huan, C.H.A. ; Tan, H.S. ; Tan, K.L. 
11Jul-1998Auger electron spectroscopy and x-ray photoelectron spectroscopy analysis of angle of incidence effects of ion beam nitridation of GaAsPan, J.S. ; Huan, C.H.A. ; Wee, A.T.S. ; Tan, H.S. ; Tan, K.L. 
1215-Feb-1996Correlations between CdTe/CdS/SnO2/glass solar cell performance and the interface/surface propertiesFeng, Z.C.; Chou, H.C.; Rohatgi, A.; Lim, G.K.; Wee, A.T.S. ; Tan, K.L. 
131998Effects of Al-C ion-implantation and annealing in epitaxial 6H-SiC studied by structural and optical techniquesFeng, Z.C.; Ferguson, I.; Stall, R.A.; Li, K.; Shi, Y.; Singh, H.; Tone, K.; Zhao, J.H.; Wee, A.T.S. ; Tan, K.L. ; Adar, F.; Lenain, B.
14Mar-1999Growth of carbon nitride thin films by radio-frequency-plasma-enhanced chemical vapor deposition at low temperaturesLim, S.F.; Wee, A.T.S. ; Lin, J. ; Chua, D.H.C. ; Tan, K.L. 
151994Investigation of titanium silicide formation using secondary ion mass spectrometryWee, Andrew T.S. ; Huan, Alfred C.H. ; Thian, W.H.; Tan, K.L. ; Hogan, Royston
1627-Oct-1997Ionization probability of Si+ ion emission from clean Si under Ar+ bombardmentLow, M.H.S.; Huan, C.H.A. ; Wee, A.T.S. ; Tan, K.L. 
17Feb-1996Secondary ion emission from silicon under 8 keV O2 + and Ar+ ion bombardmentHuan, C.H.A. ; Wee, A.T.S. ; Low, H.S.M.; Tan, K.L. 
181-Mar-1994SIMS study of NO, CO adsorption on Cu(100) and Cu(210) surfacesWee, A.T.S. ; Lin, J. ; Huan, A.C.H. ; Loh, F.C. ; Tan, K.L. 
19Jan-1993Static SIMS of conjugated polymers: films of the substituted polyacetylenesHuan, C.H.A. ; Wee, A.T.S. ; Gopalakrishnan, R. ; Tan, K.L. ; Kang, E.T. ; Neoh, K.G. ; Liaw, D.J.
20Nov-1991Static SIMS of polyacetylene: the effect of chain unsaturationWee, A.T.S. ; Huan, C.H.A. ; Gopalakrishnan, R. ; Tan, K.L. ; Kang, E.T. ; Neoh, K.G. ; Shirakawa, H.