1. ScholarBank@NUS

Voon Yew Thean

rp31809

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Publications

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Date Issued:  [2010 TO 2019]
Department:  DEAN'S OFFICE (ENGINEERING)
Policy:  Open

Results 1-12 of 12 (Search time: 0.007 seconds).

Issue DateTitleAuthor(s)
16-Feb-2019A flexible InGaAs nanomembrane PhotoFET with tunable responsivities in near-and short-wave IR region for lightweight imaging applicationsTHEAN VOON YEW, AARON 
210-Feb-2018A FLEXIBLE LIQUID-METAL ALLOY BANDPASS FILTERRongqiang Li; GUO YONGXIN ; Wei Chen; Yida Li; THEAN VOON YEW, AARON 
31-Dec-2019A fully-printed flexible MoS2 memristive artificial synapse with femto joules switching energyTHEAN VOON YEW, AARON 
414-Jun-2019A statistical Seebeck coefficient model based on percolation theory in two-dimensional disordered systemsTHEAN VOON YEW, AARON 
515-Nov-2019All WSe2 1T1R resistive RAM cell for future monolithic 3D embedded memory integrationTHEAN VOON YEW, AARON 
65-Nov-2019An 8.2- μ W 0.14-mm2 16-Channel CDMA-Like Capacitance-to-Digital ConverterLUO YUXUAN ; LI YIDA ; THEAN VOON YEW, AARON ; HENG CHUN HUAT 
78-Aug-2019Design of Artificial Spiking Neuron with SiO2 Memristive Synapse to Demonstrate Neuron-Level Spike Timing Dependent PlasticityNIU XUHUA ; LI YIDA ; UMESH CHAND ; LEONG JIN FENG ; EVGENY ZAMBURG ; THEAN VOON YEW, AARON 
814-Jun-2018Percolation theory based statistical resistance model for resistive random access memoryWANG LINGFEI ; THEAN VOON YEW, AARON 
99-Nov-2019Plasmonic interconnects for global wires in integrated circuitsSoo-jin Chua ; Yan Liu ; Lu Ding; Aaron Thean ; Ting Mei; Christian A. Nijhuis 
102016Polarity control in WSe2 double-gate transistorsResta, G.V; Sutar, S; Balaji, Y; Lin, D; Raghavan, P; Radu, I; Catthoor, F; Thean, A ; Gaillardon, P.-E; De Micheli, G
112017Processing technologies for advanced Ge devicesLoo, R; Hikavyy, A.Y; Witters, L; Schulze, A; Arimura, H; Cott, D; Mitard, J; Porret, C; Mertens, H; Ryan, P; Wall, J; Matney, K; Wormington, M; Favia, P; Richard, O; Bender, H; Thean, A ; Horiguchi, N; Mocuta, D; Collaert, N
122016Toward error-free scaled spin torque majority gatesVaysset, A; Manfrini, M; Nikonov, D.E; Manipatruni, S; Young, I.A; Pourtois, G; Radu, I.P; Thean, A