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Sim Kian Sin

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Full Name
Sim Kian Sin
Variants
Sim, K.S.
Sim, K.
 
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Publications

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Department:  ELECTRICAL ENGINEERING

Results 1-7 of 7 (Search time: 0.004 seconds).

Issue DateTitleAuthor(s)
1Sep-1993A simulation model for electron irradiation induced specimen charging in a scanning electron microscopeChan, D.S.H. ; Sim, K.S. ; Phang, J.C.H. ; Balk, L.J.; Uchikawa, Y.; Hasselbach, F.; Dinnis, A.R.
21994Charging dynamics of integrated circuit passivation layer probe holes in the electron beam testerPhang, J.C.H. ; Sim, K.S. ; Chan, D.S.H. 
3Nov-1995Effect of micro-extraction field and physical dimensions on the charging dynamics of integrated circuit passivation layer probe-holes in the electron beam testerSim, K.S. ; Phang, J.C.H. ; Chan, D.S.H. 
4Mar-1994Investigation of capacitive coupling voltage contrast using a specimen charging modelSim, K. ; Chan, D. ; Phang, J. 
5Mar-1994Investigation of capacitive coupling voltage contrast using a specimen charging modelSim, K. ; Chan, D. ; Phang, J. 
6Dec-1992Modelling techniques for the quantification of some electron beam induced phenomenaChim, W.K. ; Chan, D.S.H. ; Low, T.S. ; Phang, J.C.H. ; Sim, K.S. ; Pey, K.L. ; Dinnis, A.R.; Holt, D.B.; Nakamae, K.; Schottler, M.
7Dec-1992Modelling techniques for the quantification of some electron beam induced phenomenaChim, W.K. ; Chan, D.S.H. ; Low, T.S. ; Phang, J.C.H. ; Sim, K.S. ; Pey, K.L. ; Dinnis, A.R.; Holt, D.B.; Nakamae, K.; Schottler, M.