Full Name
SIM CHOW HONG
Variants
Sim, C.H.
 
 
 
Email
msesch@nus.edu.sg
 

Publications

Results 1-15 of 15 (Search time: 0.557 seconds).

Issue DateTitleAuthor(s)
1Jul-2006Bilayered Pb(Zr,Ti)O3/(Bi,Nd)4Ti3O 12 thin filmsSim, C.H. ; Gao, X.S.; Zhou, Z.H. ; Wang, J. 
2Dec-2008Bilayered Pb(Zr,Ti)O3/(Bi,Nd)4Ti3O 12 thin filmsSim, C.H. ; Xue, J.M. ; Gao, X.S. ; Zhou, Z.H. ; Wang, J. 
32009Charged defects and their effects on electrical behavior in Bi 1-x Lax FeO3 thin filmsWang, Y. ; Zheng, R.Y. ; Sim, C.H. ; Wang, J. 
4Oct-2008Effects of SRO buffer layer on multiferroic BiFeO3 thin filmsZheng, R.Y. ; Sim, C.H. ; Wang, J. ; Ramakrishna, S. 
52006Fatigue behavior of heterostructured Pb(Zr, Ti)O3/(Bi, Nd) 4Ti3O12 ferroelectric thin filmsSim, C.H. ; Soon, H.P. ; Zhou, Z.H. ; Wang, J. 
62007Ferroelectric and dielectric behavior of heterolayered PZT thin filmsKartawidjaja, F.C. ; Sim, C.H. ; Wang, J. 
72007Ferroelectric and dielectric behavior of heterolayered PZT thin filmsKartawidjaja, F.C. ; Sim, C.H. ; Wang, J. 
82008Ferroelectric and fatigue behavior of Pb(Zr0.52 Ti 0.48)O3/(Bi3.15Nd0.85)Ti 3O12 bilayered thin filmsSim, C.H. ; Zhou, Z.H. ; Gao, X.S. ; Soon, H.P. ; Wang, J. 
92008Ferroelectric transitions by Ca substitution in Pb0.7 Nd0.2 TiO3Wang, J. ; Sim, C.H. ; Lao, Z.; Soon, H.P. 
102008Ferroelectric transitions by Ca substitution in Pb0.7 Nd0.2 TiO3Wang, J. ; Sim, C.H. ; Lao, Z.; Soon, H.P. 
11Jun-2009Formation and evolution of body-centered orthorhombic mesophase in TiO 2 thin filmsZhang, Y. ; Sim, C.H. ; Yuwono, A.H. ; Li, J. ; Wang, J. 
122007Heterolayered ferroelectric Pb(Zr,Ti)O3/(Bi,Nd) 4Ti3O12 thin filmsSim, C.H. ; Wang, J. 
13Oct-2009Heterolayered PZT thin films of different thicknesses and stacking sequenceKartawidjaja, F.C. ; Sim, C.H. ; Wang, J. 
142009Residual stress and magnetic behavior of multiferroic CoFe2 O4 /Pb (Zr0.52 Ti0.48) O3 thin filmsSim, C.H. ; Pan, Z.Z.; Wang, J. 
152008Thickness and coupling effects in bilayered multiferroic CoFe 2O4/Pb (Zr0.52Ti0.48)O3 thin filmsSim, C.H. ; Pan, A.Z.Z.; Wang, J.