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Title: Residual stress and magnetic behavior of multiferroic CoFe2 O4 /Pb (Zr0.52 Ti0.48) O3 thin films
Authors: Sim, C.H. 
Pan, Z.Z.
Wang, J. 
Issue Date: 2009
Citation: Sim, C.H., Pan, Z.Z., Wang, J. (2009). Residual stress and magnetic behavior of multiferroic CoFe2 O4 /Pb (Zr0.52 Ti0.48) O3 thin films. Journal of Applied Physics 105 (8) : -. ScholarBank@NUS Repository.
Abstract: Multiferroic composite thin films consisting of CoFe2 O 4 (CFO) and Pb (Zr0.52 Ti0.48) O3 (PZT) layers were deposited through a combined route of rf magnetron sputtering and sol gel on Pt (111) / TiO2 / SiO2 /Si substrates. The coupling effects in the bilayered thin film were studied by looking at the relationships among the crystallite orientation, magnetic behavior, and the in-plane residual stress. Phase selective residual stress analysis conducted by using x-ray method demonstrated a close correlation between the stress imposed on the PZT layer and its texture. A change in the PZT layer orientation from (1- 11) to (010) with the increasing layer thickness was observed in the multiferroic thin film as the system changes from an interface energy minimizing texture to a strain energy density minimizing texture. The CFO phase in the multiferroic thin films was preferably oriented in the (111) orientation. However, there is a change in magnetization as well as coercivity of the multiferroic thin films when the top PZT layer was varied in thickness. A close correlation between the magnetization and the in-plane stress in the CFO bottom layer imposed by the PZT film thickness was observed. © 2009 American Institute of Physics.
Source Title: Journal of Applied Physics
ISSN: 00218979
DOI: 10.1063/1.3115452
Appears in Collections:Staff Publications

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