Ling Chung Ho

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Full Name

Ling Chung Ho

(not current staff)

Variants

Ling, C.-H.
Ling, C.
Ling, C.H.
Ling, Chung Ho
Ling, Chung-Ho

Main Affiliation

ELECTRICAL AND COMPUTER ENGINEERING

Faculty

FAC OF ENGINEERING

eleling@nus.edu.sg

Refined By:

Author: Ah, L.K.

Results 1-9 of 9 (Search time: 0.004 seconds).

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	Issue Date	Title	Author(s)
1	Nov-1992	Characterization of charge trapping in submicrometer NMOSFET's by gate capacitance measurements	Ling, C.H. ; Yeow, Y.T.; Ah, L.K.
2	1997	Correspondence between gated-diode drain current and charge pumping current in hot-carrier stressed n- and p-MOSFET's	Goh, Y.H.; Ah, L.K.; Ling, C.H.
3	Jul-1994	Hot-electron degradation in NMOSFET's: Results from temperature anneal	Ling, C.H. ; Ah, L.K.; Choi, W.K. ; Tan, S.E.; Ang, D.S.
4	1-Jan-1993	Logarithmic time dependence of pMOSFET degradation observed from gate capacitance	Ling, C.H. ; Yeow, Y.T.; Ah, L.K.; Yung, W.H.; Choi, W.K.
5	Jul-1991	Observation of MOSFET degradation due to electrical stressing through gate-to-source and gate-to-drain capacitance measurement	Yeow, Y.T.; Ling, C.H. ; Ah, L.K.
6	Jul-1991	Observation of MOSFET degradation due to electrical stressing through gate-to-source and gate-to-drain capacitance measurement	Yeow, Y.T.; Ling, C.H. ; Ah, L.K.
7	1995	Recombination lifetime in silicon from laser microwave photoconductance decay measurement	Ling, C.H. ; Teoh, H.K.; Choi, W.K. ; Zhou, T.Q. ; Ah, L.K.
8	1995	Recombination lifetime in silicon from laser microwave photoconductance decay measurement	Ling, C.H. ; Teoh, H.K.; Choi, W.K. ; Zhou, T.Q. ; Ah, L.K.
9	1995	Study of rf-sputtered yttrium oxide films on silicon by capacitance measurements	Ling, C.H. ; Bhaskaran, J.; Choi, W.K. ; Ah, L.K.