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Osipowicz Thomas

rp05639

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Full Name
Osipowicz Thomas
Variants
Osipowitcz, T.
Osipowicz, T.
OSIPOWICZ, THOMAS
Osiposwicz, T.
Thomas, O.
Osipowice, T.
Osipowicz Thomas
 
Main Affiliation
 
Faculty
 
Email
phyto@nus.edu.sg
 

Publications

Refined By:
Author:  Sanchez, J.L.
Type:  Article

Results 1-10 of 10 (Search time: 0.007 seconds).

Issue DateTitleAuthor(s)
1Mar-1998A high resolution beam scanning system for deep ion beam lithographySanchez, J.L.; Van Kan, J.A. ; Osipowicz, T. ; Springham, S.V.; Watt, F. 
2Mar-1998Fluence dependence of IBIC collection efficiency of CMOS transistorsOsipowicz, T. ; Sanchez, J.L.; Orlic, I. ; Watt, F. ; Kolachina, S.; Chan, D.S.H. ; Phang, J.C.H. 
3Jul-1997Micro-PIXE analysis of trace element concentrations of natural rubies from different locations in MyanmarSanchez, J.L.; Osipowicz, T. ; Tang, S.M. ; Tay, T.S.; Win, T.T.
4Jul-1997Micromachining using deep ion beam lithographySpringham, S.V.; Osipowicz, T. ; Sanchez, J.L.; Gan, L.H.; Watt, F. 
51999Micromachining using focused high energy ion beams: Deep Ion Beam LithographyVan Kan, J.A. ; Sanchez, J.L.; Xu, B.; Osipowicz, T. ; Watt, F. 
62-Sep-1999Proton micromachining of substrate scaffolds for cellular and tissue engineeringSanchez, J.L.; Guy, G. ; Van Kan, J.A. ; Osipowicz, T. ; Watt, F. 
7Feb-2000Proton micromachining: A new technique for the production of three-dimensional microstructuresVan Kan, J.A. ; Sanchez, J.L.; Osipowicz, T. ; Watt, F. 
8Jul-1997Recent results in ion beam induced charge microscopy: Unconnected junction contrast and an assessment of single contact IBICOsipowicz, T. ; Sanchez, J.L.; Orlić, I. ; Watt, F. ; Kolachina, S.; Ong, V.K.S. ; Chan, D.S.H. ; Phang, J.C.H. 
92-Sep-1999Resist materials for proton micromachiningVan Kan, J.A. ; Sanchez, J.L.; Xu, B.; Osipowicz, T. ; Watt, F. 
102000The use of proton microbeams for the production of microcomponentsOsipowicz, T. ; Van Kan, J.A. ; Sum, T.C. ; Sanchez, J.L.; Watt, F.