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Wai Kin Chim

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Full Name
Wai Kin Chim
Variants
CHIM, WAI KIN
Chim, W.-K.
CBIM, W. K.
CHIM, WAI K.
Chim, W.K.
KIN, CHIM WAI
Chim Wai Kin
 
Main Affiliation
 
Faculty
 
Email
elecwk@nus.edu.sg
 

Publications

Results 61-80 of 208 (Search time: 0.007 seconds).

Issue DateTitleAuthor(s)
611999Electrical and structural properties of rapid thermal annealed RF sputtered silicon oxide filmsChoi, W.K. ; Han, K.K.; Chim, W.K. 
62Apr-2003Electrical characterization of a trilayer germanium nanocrystal memory deviceHo, V.; Tay, M.S.; Moey, C.H.; Teo, L.W.; Choi, W.K. ; Chim, W.K. ; Heng, C.L.; Lei, Y.
63Oct-1999Electromagnetic calculations of the near field of a tip under polarized laser irradiationLu, Y.-F. ; Mai, Z.-H.; Chim, W.-K. 
641-Jan-1988ELECTRON TRAJECTORY TRACKING ALGORITHMS FOR ANALYSING VOLTAGE CONTRAST SIGNALS IN THE SCANNING ELECTRON MICROSCOPE.Chim, W.K. ; Low, T.S. ; Chan, D.S.H. ; Phang, J.C.H. 
652009Erratum: "band alignment of yttrium oxide on various relaxed and strained semiconductor substrates" (J. Appl. Phys. (2008) 103 (083702))Chiam, S.Y.; Chim, W.K. 
66Jun-1991Error voltage components in quantitative voltage contrast measurement systemsChan, D.S.H. ; Low, T.S. ; Chim, W.K. ; Phang, J.C.H. 
672000Estimation of the area of voids in deep-submicron aluminium interconnects using resistance-noise measurementsChu, L.W.; Pey, K.L. ; Chim, W.K. ; Loh, S.K.; Er, E.
681-Nov-2011Evaluating the use of electronegativity in band alignment models through the experimental slope parameter of lanthanum aluminate heterostructuresLiu, Z.Q.; Chim, W.K. ; Chiam, S.Y.; Pan, J.S.; Ng, C.M.
691998Evaluation of electrical stress effects on SiO2-Si structures using scanning electron microscope cathodoluminescenceLiu, X.; Chan, D.S.H. ; Chim, W.K. ; Phang, J.C.H. 
702016Evidences for redox reaction driven charge transfer and mass transport in metal-assisted chemical etching of siliconKong, L; Dasgupta, B; Ren, Y; Mohseni, P.K; Hong, M ; Li, X; Chim, W.K ; Chiam, S.Y
71Aug-2011Examining the transparency of gallium-doped zinc oxide for photovoltaic applicationsWong, L.M.; Chiam, S.Y.; Huang, J.Q.; Wang, S.J.; Chim, W.K. ; Pan, J.S.
72Jul-1998Experimental and numerical investigation of the surface reliefs formed on a moving silicon substrate by pulses of a Gaussian laserWee, T.-S.; Lu, Y.-F. ; Chim, W.-K. 
7315-Feb-1997Extraction of metal-oxide-semiconductor field-effect-transistor interface state and trapped charge spatial distributions using a physics-based algorithmChim, W.K. ; Leang, S.E.; Chan, D.S.H. 
14Sep-2004Fabrication and characterization of a trilayer germanium nanocrystal memory device with hafnium dioxide as the tunnel dielectricNg, T.H.; Ho, V.; Teo, L.W.; Tay, M.S.; Koh, B.H.; Chim, W.K. ; Choi, W.K. ; Du, A.Y.; Tung, C.H.
1513-Jul-2010Fabrication of silicon nanowires with precise diameter control using metal nanodot arrays as a hard mask blocking material in chemical etchingHuang, J.; Chiam, S.Y.; Tan, H.H.; Wang, S.; Chim, W.K. 
1614-Mar-2007First-principles study of native point defects in hafnia and zirconiaZheng, J.X.; Ceder, G.; Maxisch, T.; Chim, W.K. ; Choi, W.K. 
17Oct-2008First-principles study on the concentrations of native point defects in high-dielectric-constant binary oxide materialsZheng, J.X.; Ceder, G.; Chim, W.K. 
182-Feb-2006Formation of germanium nanocrystals in thick silicon oxide matrix on silicon substrate under rapid thermal annealingChoi, W.K. ; Chew, H.G.; Ho, V.; Ng, V. ; Chim, W.K. ; Ho, Y.W.; Ng, S.P.
198-Oct-2010Formation of Nickel oxide nanotubes with uniform wall thickness by low-temperature thermal oxidation through understanding the limiting effect of vacancy diffusion and the kirkendall phenomenonRen, Y.; Chim, W.K. ; Chiam, S.Y.; Huang, J.Q.; Pi, C.; Pan, J.S.
2027-Feb-2012Formation of the yttrium/germanium interface: Fermi-level pinning and intermixing at room temperatureLiu, Z.Q.; Chim, W.K. ; Chiam, S.Y.; Pan, J.S.; Ng, C.M.