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Khiang Wee Lim

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Full Name
Khiang Wee Lim
Variants
Wee, L.K.
Lim, K.W.
Lim, Khiang Wee
Lim, Khiang-Wee
Lim, K.-W.
 
Main Affiliation
 
Faculty
 
Email
kwlim@nus.edu.sg
 
Other emails
 

Publications

Refined By:
Date Issued:  [2000 TO 3000]
Type:  Conference Paper

Results 1-14 of 14 (Search time: 0.011 seconds).

Issue DateTitleAuthor(s)
12000A benchtop plant for evaluation of flexible structure control methodologiesBin, L.; Ho, W.K. ; Lim, K.W. ; Sin, K.K. 
22000A new observer-based sensorless adaptive fuzzy controller for switched reluctance motor drivesShi, C.; Cheok, A.D. ; Lim, K.W. 
32007Clustering intelligent sensor nodes for distributed fault detection & diagnosisJoe, Y.Y.; Ho, W.K. ; Lim, K.W. ; Ding, Z.Q.; Zhang, J.B.; Ling, K.V.; Romagnoli, J.A.
42004Comparative study of PCA approaches in process monitoring and fault detectionTien, D.X.; Lim, K.-W. ; Jun, L.
52002Control and signal processing for photoresist processing in microlithographyTay, A. ; Ho, W.K. ; Lim, K.W. ; Loh, A.P. ; Tan, W.W. 
62000Diagnosability of faults using finite-state automaton modelXi, YunXia; Lim, Khiang-Wee ; Ho, Weng-Khuen ; Preisig, Heinz A.
72000Evaluating the robustness of a sensorless controller for permanent magnet synchronous motor drivesPek, W.K.; Lim, K.W. ; Panda, S.K. 
82001Fault diagnosis using dynamic finite-state automaton modelsXi, Y.-X.; Lim, K.-W. ; Ho, W.-K. ; Preisig, H.A.
92005In-situ measurement & control of photoresist development in microlithographyKiew, C.M.; Tay, A. ; Ho, W.K. ; Lim, K.W. ; Zhou, Y.
10May-2004Integrated bake/chill module with in situ temperature measurement for photoresist processingTay, A. ; Ho, W.-K. ; Loh, A.-P. ; Lim, K.-W. ; Tan, W.-W. ; Schaper, C.D.
112006Robust real-time thin film thickness estimationKiew, C.M.; Tay, A. ; Ho, W.K. ; Lim, K.W. ; Lee, J.H.
122001Sensorless rotor position estimation algorithm for switched reluctance motors using fuzzy logicWang, Z.; Cheok, A.D. ; Wee, L.K. 
132003Tailoring Automata for Fault DiagnosabilityPreisig, H.A.; Xi, Y.X.; Lim, K.W. 
142003Warpage Detection during Baking of Semiconductor substrate in MicrolithographyHo, W.K. ; Tay, A. ; Lim, K.W. ; Zhou, Y.; Yang, K.