Please use this identifier to cite or link to this item:
https://doi.org/10.1109/IECON.2002.1185495
Title: | Control and signal processing for photoresist processing in microlithography | Authors: | Tay, A. Ho, W.K. Lim, K.W. Loh, A.P. Tan, W.W. |
Issue Date: | 2002 | Citation: | Tay, A.,Ho, W.K.,Lim, K.W.,Loh, A.P.,Tan, W.W. (2002). Control and signal processing for photoresist processing in microlithography. IECON Proceedings (Industrial Electronics Conference) 2 : 1468-1473. ScholarBank@NUS Repository. https://doi.org/10.1109/IECON.2002.1185495 | Abstract: | The lithography process is a critical step in the fabrication of nanostructures for integrated circuit manufacturing. In this paper, a summary is presented of several projects applying control and signal processing techniques to lithography. We begin with a presentation of a non-optical lithography process under development in our lab. The proposed lithography technique is based on chemically altering the surface in a spatially selective manner to achieve a patterned substrate. In addition to the exposure step, photoresist processing is also critical in lithography. Based on current limitations of photoresist thermal processing system, a new integrated system is designed to improve the performance of temperature sensitive chemically amplified photoresists used in deep-UV lithography. Two case studies where control and signal processing techniques have made an impact in photoresist processing are also presented. | Source Title: | IECON Proceedings (Industrial Electronics Conference) | URI: | http://scholarbank.nus.edu.sg/handle/10635/69723 | DOI: | 10.1109/IECON.2002.1185495 |
Appears in Collections: | Staff Publications |
Show full item record
Files in This Item:
There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.