Please use this identifier to cite or link to this item:
https://doi.org/10.1109/IECON.2002.1185495
DC Field | Value | |
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dc.title | Control and signal processing for photoresist processing in microlithography | |
dc.contributor.author | Tay, A. | |
dc.contributor.author | Ho, W.K. | |
dc.contributor.author | Lim, K.W. | |
dc.contributor.author | Loh, A.P. | |
dc.contributor.author | Tan, W.W. | |
dc.date.accessioned | 2014-06-19T03:03:55Z | |
dc.date.available | 2014-06-19T03:03:55Z | |
dc.date.issued | 2002 | |
dc.identifier.citation | Tay, A.,Ho, W.K.,Lim, K.W.,Loh, A.P.,Tan, W.W. (2002). Control and signal processing for photoresist processing in microlithography. IECON Proceedings (Industrial Electronics Conference) 2 : 1468-1473. ScholarBank@NUS Repository. <a href="https://doi.org/10.1109/IECON.2002.1185495" target="_blank">https://doi.org/10.1109/IECON.2002.1185495</a> | |
dc.identifier.uri | http://scholarbank.nus.edu.sg/handle/10635/69723 | |
dc.description.abstract | The lithography process is a critical step in the fabrication of nanostructures for integrated circuit manufacturing. In this paper, a summary is presented of several projects applying control and signal processing techniques to lithography. We begin with a presentation of a non-optical lithography process under development in our lab. The proposed lithography technique is based on chemically altering the surface in a spatially selective manner to achieve a patterned substrate. In addition to the exposure step, photoresist processing is also critical in lithography. Based on current limitations of photoresist thermal processing system, a new integrated system is designed to improve the performance of temperature sensitive chemically amplified photoresists used in deep-UV lithography. Two case studies where control and signal processing techniques have made an impact in photoresist processing are also presented. | |
dc.description.uri | http://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1109/IECON.2002.1185495 | |
dc.source | Scopus | |
dc.type | Conference Paper | |
dc.contributor.department | ELECTRICAL & COMPUTER ENGINEERING | |
dc.description.doi | 10.1109/IECON.2002.1185495 | |
dc.description.sourcetitle | IECON Proceedings (Industrial Electronics Conference) | |
dc.description.volume | 2 | |
dc.description.page | 1468-1473 | |
dc.description.coden | IEPRE | |
dc.identifier.isiut | NOT_IN_WOS | |
Appears in Collections: | Staff Publications |
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