Please use this identifier to cite or link to this item: https://doi.org/10.1109/IECON.2002.1185495
DC FieldValue
dc.titleControl and signal processing for photoresist processing in microlithography
dc.contributor.authorTay, A.
dc.contributor.authorHo, W.K.
dc.contributor.authorLim, K.W.
dc.contributor.authorLoh, A.P.
dc.contributor.authorTan, W.W.
dc.date.accessioned2014-06-19T03:03:55Z
dc.date.available2014-06-19T03:03:55Z
dc.date.issued2002
dc.identifier.citationTay, A.,Ho, W.K.,Lim, K.W.,Loh, A.P.,Tan, W.W. (2002). Control and signal processing for photoresist processing in microlithography. IECON Proceedings (Industrial Electronics Conference) 2 : 1468-1473. ScholarBank@NUS Repository. <a href="https://doi.org/10.1109/IECON.2002.1185495" target="_blank">https://doi.org/10.1109/IECON.2002.1185495</a>
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/69723
dc.description.abstractThe lithography process is a critical step in the fabrication of nanostructures for integrated circuit manufacturing. In this paper, a summary is presented of several projects applying control and signal processing techniques to lithography. We begin with a presentation of a non-optical lithography process under development in our lab. The proposed lithography technique is based on chemically altering the surface in a spatially selective manner to achieve a patterned substrate. In addition to the exposure step, photoresist processing is also critical in lithography. Based on current limitations of photoresist thermal processing system, a new integrated system is designed to improve the performance of temperature sensitive chemically amplified photoresists used in deep-UV lithography. Two case studies where control and signal processing techniques have made an impact in photoresist processing are also presented.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1109/IECON.2002.1185495
dc.sourceScopus
dc.typeConference Paper
dc.contributor.departmentELECTRICAL & COMPUTER ENGINEERING
dc.description.doi10.1109/IECON.2002.1185495
dc.description.sourcetitleIECON Proceedings (Industrial Electronics Conference)
dc.description.volume2
dc.description.page1468-1473
dc.description.codenIEPRE
dc.identifier.isiutNOT_IN_WOS
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