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Eng Soon Tok

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Full Name
Eng Soon Tok
Variants
Tok, E.-S.
Tok, E.
TOK, E.S.T
Tok, Eng Soon
Tok Eng Soon
Soon Tok, E.
Tok E.S.
Tok, E.S.
 
Main Affiliation
 
Faculty
 
Email
phytokes@nus.edu.sg
 

Publications

Refined By:
Department:  INSTITUTE OF ENGINEERING SCIENCE
Author:  Liu, R.S.

Results 1-9 of 9 (Search time: 0.004 seconds).

Issue DateTitleAuthor(s)
115-Mar-2006Co growth on Si(0 0 1) and Si(1 1 1) surfaces: Interfacial interaction and growth dynamicsPan, J.S.; Liu, R.S. ; Zhang, Z.; Poon, S.W. ; Ong, W.J.; Tok, E.S. 
2Apr-2003Dynamics and surface segregation during GSMBE of Si1-yCy and Si1-x-yGexCy on the Si(0 0 1) surfacePrice, R.W.; Tok, E.S. ; Liu, R. ; Wee, A.T.S. ; Woods, N.J.; Zhang, J.
314-Feb-2002Growth mechanisms in thin film epitaxy of Si/SiGe from hydridesZhang, J.; Woods, N.J.; Breton, G.; Price, R.W.; Hartell, A.D.; Lau, G.S.; Liu, R. ; Wee, A.T.S. ; Tok, E.S. 
4Nov-2003Nanostructure formation by O2 + ion sputtering of Si/SiGe heterostructuresLau, G.S.; Tok, E.S. ; Liu, R. ; Wee, A.T.S. ; Tjiu, W.C.; Zhang, J.
5Aug-2006Probing Co/Si interface behaviour by X-ray photoelectron spectroscopy (XPS) and atomic force microscopy (AFM)PAN, J.S.P; LIU, R.S.L ; TOK, E.S.T 
610-Jun-2003Probing the behaviour of ultra thin Co layers on clean and hydrogen terminated Si(0 0 1) and Si(1 1 1) surfacesPan, J.S.; Tok, E.S. ; Huan, C.H.A. ; Liu, R.S. ; Chai, J.W.; Ong, W.J.; Toh, K.C.
7Jan-2004Roughening behavior in Si/SiGe heterostructures under O2 + bombardmentLau, G.S.; Tok, E.S. ; Liu, R. ; Wee, A.T.S. ; Zhang, J.
81-Jun-2006Sharp n-type doping profiles in Si/SiGe heterostructures produced by atomic hydrogen etchingZhang, J.; Turner, S.G.; Chiam, S.Y.; Liu, R. ; Tok, E.S. ; Wee, A.T.S. ; Huan, A.C.H.; Kelly, I.; Mulcahy, C.P.A.
92001The investigation of surface topography development in Si(001) and Si(111) during SIMS depth profilingLau, G.S.; Tok, E.S. ; Wee, A.T.S. ; Liu, R. ; Lim, S.L.