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Title: Sharp n-type doping profiles in Si/SiGe heterostructures produced by atomic hydrogen etching
Authors: Zhang, J.
Turner, S.G.
Chiam, S.Y.
Liu, R. 
Tok, E.S. 
Wee, A.T.S. 
Huan, A.C.H.
Kelly, I.
Mulcahy, C.P.A.
Keywords: Growth
Molecular beam epitaxy
Secondary ion mass spectroscopy
Surface segregation
X-ray diffraction
Issue Date: 1-Jun-2006
Citation: Zhang, J., Turner, S.G., Chiam, S.Y., Liu, R., Tok, E.S., Wee, A.T.S., Huan, A.C.H., Kelly, I., Mulcahy, C.P.A. (2006-06-01). Sharp n-type doping profiles in Si/SiGe heterostructures produced by atomic hydrogen etching. Surface Science 600 (11) : 2288-2292. ScholarBank@NUS Repository.
Abstract: Surface segregation of group V dopant during thin film epitaxy of Si/SiGe heterostructures causes severe limitation on the sharpness of n-type doping profiles in pn junctions. Existing techniques for removal of surface segregated arsenic suffer from either high thermal budget or aggressive (ex situ) wet chemical etching. An in situ low temperature method is clearly desirable, particularly for device structures with high Ge content such as resonant tunnelling diodes, in order to minimize diffusion of the matrix elements as well as maintain structural integrity. In situ etching by atomic hydrogen is shown to be ideal for this purpose. The reaction mechanism ensures that this can only be a low temperature process and the method is shown to be highly effective and selective in the removal of surface segregated As. In comparison with other techniques, atomic hydrogen etching is also shown to be less aggressive and has a smaller impact on the surface/interface quality. © 2006 Elsevier B.V. All rights reserved.
Source Title: Surface Science
ISSN: 00396028
DOI: 10.1016/j.susc.2006.03.045
Appears in Collections:Staff Publications

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