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Pey Kin Leong

rp03121

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Full Name
Pey Kin Leong
Variants
PEY, KIN-LEONG
PEY, KIN L.
LEONG, KIN
Pey, Kin Leong
PEY, KIN LEONG
Pey, K.L.
 
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Publications

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Department:  INSTITUTE OF MICROELECTRONICS
Author:  Chan, Daniel S.H.

Results 1-9 of 9 (Search time: 0.004 seconds).

Issue DateTitleAuthor(s)
11995Cathodoluminescence contrast of localized defects part I. Numerical model for simulationPey, K.L. ; Chan, D.S.H. ; Phang, J.C.H. ; Breese, J.F.; Myhajlenko, S.
21995Cathodoluminescence contrast of localized defects part II. Defect investigationPey, K.L. ; Phang, J.C.H. ; Chan, D.S.H. ; Breeze, J.F.; Myhajlenko, S.
31996Design and characterisation of a single-reflection, solid-state detector with high discrimination against backscattered electrons for cathodoluminescence microscopyPey, K.L. ; Phang, J.C.H. ; Chan, D.S.H. ; Leong, Y.K.
421-Nov-1995Double reflection cathodoluminescence detector with extremely high discrimination against backscattered electronsCHAN, DANIEL S. H. ; LEONG, KIN ; PHANG, JACOB C. H. 
5Dec-1993Investigation of dislocations in GaAs using cathodoluminescence in the scanning electron microscopePey, K.L. ; Phang, J.C.H. ; Chan, D.S.H. ; Balk, L.J.; Jakubowicz, A.; Bresse, J.F.; Myhajlenko, S.
6Dec-1993Investigation of dislocations in GaAs using cathodoluminescence in the scanning electron microscopePey, K.L. ; Phang, J.C.H. ; Chan, D.S.H. ; Balk, L.J.; Jakubowicz, A.; Bresse, J.F.; Myhajlenko, S.
7Jul-1994Optoelectronic material analysis and device failure analysis using SEM cathodoluminescencePey, K.L. ; Chim, W.K. ; Phang, J.C.H. ; Chan, D.S.H. 
8Aug-1993Semiconductor parameters extraction using cathodoluminescence in the scanning electron microscopeChan, Daniel S.H. ; Pey, Kin Leong ; Phang, Jacob C.H. 
9Aug-1993Semiconductor parameters extraction using cathodoluminescence in the scanning electron microscopeChan, Daniel S.H. ; Pey, Kin Leong ; Phang, Jacob C.H.