Full Name
Thye Shen, Andrew Wee
Variants
Wee, A.T.
Wee, A.T.S.
Wee A.T.S.
Thye Shen Wee, A.
Wee, A.T.S
Thye-Shen Wee, A.
Wee A.T.S
Wee, S.
Wee, A.T.-S.
Wee, A.T.A.
WEE, ANDREW THYE SHEN
Wee, T.S.
Wee, A.
Wee, Andrew T.S.
Wee, T.S.A.
Wee Thye Shen, Andrew
 
Main Affiliation
 
Faculty
 
Email
phyweets@nus.edu.sg
 

Refined By:
Date Issued:  [2000 TO 2023]
Date Issued:  [2000 TO 2009]
Author:  Sow, C.H.
Department:  OFFICE OF THE DEPUTY PRESIDENT (ACADEMIC AFFAIRS) AND PROVOST

Results 1-17 of 17 (Search time: 0.005 seconds).

Issue DateTitleAuthor(s)
117-Sep-2007A new scenario in probe local oxidation: Transient pressure-wave-assisted ionic spreading and oxide pattern formationXie, X.N. ; Chung, H.J. ; Liu, Z.J.; Yang, S.-W.; Sow, C.H. ; Wee, A.T.S. 
222-Sep-2009Chemically linked AuNP-alkane network for enhanced photoemission and field emissionXie, X.N. ; Gao, X. ; Qi, D. ; Xie, Y.; Shen, L.; Yang, S.-W.; Sow, C.H. ; Wee, A.T.S. 
31-Mar-2006Creating polymer structures of tunable electric functionality by nanoscale discharge-assisted cross-linking and oxygenationXie, X.N. ; Deng, M. ; Xu, H. ; Yang, S.W.; Qi, D.C. ; Gao, X.Y. ; Chung, H.J. ; Sow, C.H. ; Tan, V.B.C. ; Wee, A.T.S. 
49-Nov-2005Electrical discharge in a nanometer-sized air/water gap observed by atomic force microscopyXie, X.N. ; Chung, H.J. ; Sow, C.H. ; Adamiak, K.; Wee, A.T.S. 
52007Enhanced probe nano-oxidation by charge pump effect in swept tip voltage cyclesXie, X.N. ; Chung, H.J. ; Sow, C.H. ; Wee, A.T.S. 
62008Erratum: Micro/nanoscopic patterning of polymeric materials by atomic force microscope assisted electrohydrodynamic nanolithography (Journal of Applied Physics (2008) 103 (024307))Xie, X.N. ; Chung, H.J. ; Bandyopadhyay, D.; Sharma, A.; Sow, C.H. ; Wee, A.T.S. 
72007Field-induced meniscus dynamics and its impact on the nanoscale tip-surface interfaceXie, X.N. ; Chung, H.J. ; Tong, D.M. ; Sow, C.H. ; Wee, A.T.S. 
87-Aug-2009Metallic nanoparticle network for photocurrent generation and photodetectionXie, X.N. ; Xie, Y.; Gao, X. ; Sow, C.H. ; Wee, A.T.S. 
916-Apr-2007Microdroplet and atomic force microscopy probe assisted formation of acidic thin layers for silicon nanostructuringXie, X.N. ; Chung, H.J. ; Sow, C.H. ; Wee, A.T.S. 
101-Nov-2006Nanoscale materials patterning and engineering by atomic force microscopy nanolithographyXie, X.N. ; Chung, H.J. ; Sow, C.H. ; Wee, A.T.S. 
1114-Jun-2004Native oxide decomposition and local oxidation of 6H-SiC (0001) surface by atomic force microscopyXie, X.N. ; Chung, H.J. ; Sow, C.H. ; Wee, A.T.S. 
1221-Apr-2004Oxide growth and its dielectrical properties on alkylsilated native-SiO2/Si surfaceXie, X.N. ; Chung, H.J. ; Sow, C.H. ; Wee, A.T.S. 
132006Polymeric conical structure formation by probe-induced electrohydrodynamical nanofluidic motionChung, H.J. ; Xie, X.N. ; Sow, C.H. ; Bettiol, A.A. ; Wee, A.T.S. 
1423-Jun-2004Probe-induced native oxide decomposition and localized oxidation on 6H-SiC (0001) surface: An atomic force microscopy investigationXie, X.N. ; Chung, H.J. ; Xu, H. ; Xu, X. ; Sow, C.H. ; Wee, A.T.S. 
1510-Jan-2005Spatially resolved diagnosis of stress-induced breakdown in oxide dots by in situ conducting atomic force microscopyXie, X.N. ; Chung, H.J. ; Sow, C.H. ; Wee, A.T.S. 
163-Jul-2008Two coexisting modes in field-assisted AFM nanopatterning of thin polymer filmsXie, X.N. ; Chung, H.J. ; Bandyopadhyay, D.; Sharma, A.; Sow, C.H. ; Bettiol, A.A. ; Wee, A.T.S. 
176-Jun-2005Water-bridge-assisted ionic conduction in probe-induced conical polymer pattern formationXie, X.N. ; Chung, H.J. ; Sow, C.H. ; Bettiol, A.A. ; Wee, A.T.S.