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Teo Ee Jin

rp02428

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Profile

Full Name
Teo Ee Jin
(not current staff)
Variants
Teo, E.-J.
Teo, E.J.
 
Main Affiliation
 
Faculty
 
Email
phytej@nus.edu.sg
 

Publications

Refined By:
Date Issued:  [2000 TO 2023]
Department:  CHEMISTRY

Results 1-8 of 8 (Search time: 0.005 seconds).

Issue DateTitleAuthor(s)
1Mar-2002Characteristics of nickel-containing carbon films deposited using electron cyclotron resonance CVDHuang, Q.F.; Yoon, S.F.; Rusli; Zhang, Q.; Ahn, J.; Teo, E.J. ; Osipowicz, T. ; Watt, F. 
2Jul-2002Deuterium-oxygen exchange on diamond (100)-A study by ERDA, RBS and TOF-SIMSLoh, K.P. ; Xie, X.N. ; Zhang, X. ; Teo, E.J. ; Osipowicz, T. ; Lai, M.Y.; Yakovlev, N.
31-Apr-2002Gap state distribution in amorphous hydrogenated silicon carbide films deduced from photothermal deflection spectroscopyChew, K.; Rusli; Yoon, S.F.; Ahn, J.; Zhang, Q.; Ligatchev, V.; Teo, E.J. ; Osipowicz, T. ; Watt, F. 
41-Sep-2002Hydrogenated amorphous silicon carbide deposition using electron cyclotron resonance chemical vapor deposition under high microwave power and strong hydrogen dilutionChew, K.; Rusli; Yoon, S.F.; Ahn, J.; Ligatchev, V.; Teo, E.J. ; Osipowicz, T. ; Watt, F. 
5May-2002Optimal geometry for GeSi/Si super-lattice structure RBS investigationWielunski, L.S.; Osipowicz, T. ; Teo, E.J. ; Watt, F. ; Tok, E.S. ; Zhang, J.
6May-2002Proton beam micromachining: Electron emission from SU-8 resist during ion beam irradiationBettiol, A.A. ; Rajta, I. ; Teo, E.J. ; Van Kan, J.A. ; Watt, F. 
7May-2002Sub-micron channeling contrast microscopy on reactive ion etched deep Si microstructuresTeo, E.J. ; Alkaisi, M.; Bettiol, A.A. ; Osipowicz, T. ; Van Kan, J. ; Watt, F. ; Markwitz, A.
8May-2002Surface oxygenation studies on (1 0 0)-oriented diamond using an atom beam source and local anodic oxidationLoh, K.P. ; Xie, X.N. ; Lim, Y.H.; Teo, E.J. ; Zheng, J.C. ; Ando, T.