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Title: Very high density RF MIM capacitors (17 fF/μm2) using high-κ Al2O3 doped Ta2O5 dielectrics
Authors: Yang, M.Y.
Huang, C.H.
Chin, A.
Zhu, C. 
Cho, B.J. 
Li, M.F. 
Kwong, D.-L.
Keywords: Capacitor
Dielectric constant
Frequency dependence
High κ
Issue Date: Oct-2003
Citation: Yang, M.Y., Huang, C.H., Chin, A., Zhu, C., Cho, B.J., Li, M.F., Kwong, D.-L. (2003-10). Very high density RF MIM capacitors (17 fF/μm2) using high-κ Al2O3 doped Ta2O5 dielectrics. IEEE Microwave and Wireless Components Letters 13 (10) : 431-433. ScholarBank@NUS Repository.
Abstract: Using high-κ Al2O3 doped Ta2O5 dielectric, we have obtained record high MIM capacitance density of 17 fF / μm2 at 100 KHz, small 5% capacitance reduction to RF frequency range, and low leakage current density of 8.9 × 10-7 A/cm2. In combination of both high capacitor density and low leakage current density, a very low leakage current of 5.2 × 10-12 A is calculated for a typical large 10 pF capacitor used in RF IC that is even smaller than that of a deep sub-μm MOSFET. This very high capacitance density with good MIM capacitor characteristics can significantly reduce the chip size of RF ICs.
Source Title: IEEE Microwave and Wireless Components Letters
ISSN: 15311309
DOI: 10.1109/LMWC.2003.818532
Appears in Collections:Staff Publications

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