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https://doi.org/10.1002/aelm.202300820
| Title: | Direct Observation of Semimetal Contact Induced Charge Doping and Strain Effect in CVD‐Grown Monolayer MoS2 Transistors | Authors: | Xuewei Feng Zhi Gen Yu Haoyue Guo Yida Li Yong-Wei Zhang Kah Wee Ang |
Issue Date: | 5-Mar-2024 | Citation: | Xuewei Feng, Zhi Gen Yu, Haoyue Guo, Yida Li, Yong-Wei Zhang, Kah Wee Ang (2024-03-05). Direct Observation of Semimetal Contact Induced Charge Doping and Strain Effect in CVD‐Grown Monolayer MoS2 Transistors. Advanced Electronic Materials. ScholarBank@NUS Repository. https://doi.org/10.1002/aelm.202300820 | Rights: | Attribution-NonCommercial-NoDerivatives 4.0 International | Source Title: | Advanced Electronic Materials | URI: | https://scholarbank.nus.edu.sg/handle/10635/248327 | DOI: | 10.1002/aelm.202300820 | Rights: | Attribution-NonCommercial-NoDerivatives 4.0 International |
| Appears in Collections: | Elements Staff Publications |
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| Adv Elect Materials - 2024 - Feng - Direct Observation of Semimetal Contact Induced Charge Doping and Strain Effect in.pdf | 3.49 MB | Adobe PDF | OPEN | Published | View/Download |
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