Please use this identifier to cite or link to this item:
https://doi.org/10.1002/aelm.202300820
| DC Field | Value | |
|---|---|---|
| dc.title | Direct Observation of Semimetal Contact Induced Charge Doping and Strain Effect in CVD‐Grown Monolayer MoS2 Transistors | |
| dc.contributor.author | Xuewei Feng | |
| dc.contributor.author | Zhi Gen Yu | |
| dc.contributor.author | Haoyue Guo | |
| dc.contributor.author | Yida Li | |
| dc.contributor.author | Yong-Wei Zhang | |
| dc.contributor.author | Kah Wee Ang | |
| dc.date.accessioned | 2024-05-08T06:31:06Z | |
| dc.date.available | 2024-05-08T06:31:06Z | |
| dc.date.issued | 2024-03-05 | |
| dc.identifier.citation | Xuewei Feng, Zhi Gen Yu, Haoyue Guo, Yida Li, Yong-Wei Zhang, Kah Wee Ang (2024-03-05). Direct Observation of Semimetal Contact Induced Charge Doping and Strain Effect in CVD‐Grown Monolayer MoS2 Transistors. Advanced Electronic Materials. ScholarBank@NUS Repository. https://doi.org/10.1002/aelm.202300820 | |
| dc.identifier.uri | https://scholarbank.nus.edu.sg/handle/10635/248327 | |
| dc.language.iso | en | |
| dc.rights | Attribution-NonCommercial-NoDerivatives 4.0 International | |
| dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/4.0/ | |
| dc.type | Article | |
| dc.contributor.department | ELECTRICAL AND COMPUTER ENGINEERING | |
| dc.description.doi | 10.1002/aelm.202300820 | |
| dc.description.sourcetitle | Advanced Electronic Materials | |
| dc.published.state | Published | |
| Appears in Collections: | Elements Staff Publications | |
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| File | Description | Size | Format | Access Settings | Version | |
|---|---|---|---|---|---|---|
| Adv Elect Materials - 2024 - Feng - Direct Observation of Semimetal Contact Induced Charge Doping and Strain Effect in.pdf | 3.49 MB | Adobe PDF | OPEN | Published | View/Download |
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