Ling Chung Ho

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Full Name

Ling Chung Ho

(not current staff)

Variants

Ling, C.-H.
Ling, C.
Ling, C.H.
Ling, Chung Ho
Ling, Chung-Ho

Main Affiliation

ELECTRICAL AND COMPUTER ENGINEERING

Faculty

FAC OF ENGINEERING

eleling@nus.edu.sg

Refined By:

Department: BACHELOR OF TECHNOLOGY PROGRAMME

Date Issued: [2000 TO 2009]

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	Issue Date	Title	Author(s)
1	Dec-2002	A comprehensive study of indium implantation-induced damage in deep submicrometer nMOSFET: Device characterization and damage assessment	Liao, H.; Ang, D.S. ; Ling, C.H.
2	2000	Characterization of leakage current in thin gate oxide subjected to 10 KeV X-ray irradiation	Ling, C.H. ; Ang, C.H.; Ang, D.S.
3	Nov-2001	Generation-recombination noise in the near fully depleted SIMOX N-MOSFET operating in the linear region	Ang, D.S. ; Lun, Z. ; Ling, C.H.
4	2001	On the dominant interface trap generation process during hot-carrier stressing	Ang, D.S. ; Ling, C.H.