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Tay Cho Jui

rp08561

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Full Name
Tay Cho Jui
(not current staff)
Variants
Jui, T.C.
Cho, J.T.
Tay, C.-J.
Tay, C.
TAY, CHO JUI
Tay, C.J.
Jui Tay, C.
Tay C.J.
 
Main Affiliation
 
Faculty
 
Email
mpetaycj@nus.edu.sg
 

Publications

Results 241-260 of 260 (Search time: 0.006 seconds).

Issue DateTitleAuthor(s)
241Nov-2004Temporal wavelet analysis for deformation and velocity measurement in speckle interferometryFu, Y. ; Tay, C.J. ; Quan, C. ; Chen, L.J.
2422005Temporal wavelet analysis for deformation measurement of small components using micro-ESPIFu, Y. ; Tay, C.J. ; Quan, C. ; Chen, L.J.
2432003The Influence of Process Parameters on Forged Magnesium AlloysChan, C.F.; Yong, M.S.; Tay, C.J. ; Shang, H.M. 
2441991The measurement of slope using shearographyTay, C.J. ; Chau, F.S. ; Shang, H.M. ; Shim, V.P.W. ; Toh, S.L. 
2452006The study of Chromeless Phase Lithography (CPL) for 45nm lithographySoon, Y.T.; Qunying, L.; Cho, J.T. ; Chenggen, Q. 
246Jul-2001The use of carrier fringes and FFT in holographic nondestructive testingQuan, C. ; Tay, C.J. ; Shang, H.M. 
247Nov-2001The use of circular optical grating for measuring angular rotation of mirrorsShang, H.M. ; Toh, S.L. ; Fu, Y. ; Quan, C. ; Tay, C.J. 
248Sep-1997Time delay and integration imaging for inspection and profilometry of moving objectsMarokkey, S.R. ; Tay, C.J. ; Shang, H.M. ; Asundi, A.K.
249Nov-1998Time delay and integration imaging for internal profile inspectionTay, C.J. ; Toh, S.L. ; Shang, H.M. 
250Feb-1995Time-average shearography in vibration analysisToh, S.L. ; Tay, C.J. ; Shang, H.M. ; Lin, Q.Y.
2511997Triple-exposure shearography for the measurement of surface slopesTay, C.J. ; Shang, H.M. ; Choong, D.
25215-May-2011Two wavelength simultaneous DSPI and DSP for 3D displacement field measurementsBhaduri, B. ; Tay, C.J. ; Quan, C. ; Niu, H.; Sjödahl, M.
2532010Two-step dc-term-suppressed phase shifting technique in DSPIBhaduri, B. ; Tay, C.J. ; Quan, C. 
254Dec-2001Using laser scattering for detection of cracks on a microsolderball surfaceWang, S.H. ; Quan, C. ; Tay, C.J. ; Shang, H.M. 
2551-Jun-2007Vibration measurement by use of wavelet transform and temporal carrier techniqueQuan, C. ; Fu, Y. ; Tay, C.J. 
2562009Vibration measurement of a micro-structure by digital holographic microscopyShi, H. ; Fu, Y. ; Quan, C. ; Tay, C.J. ; He, X.
2572003Vibration measurement of micro-components by fringe projection methodWu, T.; Tay, C. ; Quan, C. ; Wang, S. ; Shang, H.
25820-Feb-2005Wavelet analysis of speckle patterns with a temporal carrierFu, Y. ; Tay, C.J. ; Quan, C. ; Miao, H. 
259Feb-1993Whole field measurement of surface roughness using laser speckleTay, C.J. ; Toh, S.L. ; Shang, H.M. ; Zhang, J.B.
260Sep-2001Whole field surface roughness measurement by laser speckle correlation techniqueToh, S.L. ; Quan, C. ; Woo, K.C.; Tay, C.J. ; Shang, H.M.