Time delay and integration imaging for internal profile inspection

Please use this identifier to cite or link to this item: https://doi.org/10.1016/S0030-3992(98)00078-4

Title:	Time delay and integration imaging for internal profile inspection
Authors:	Tay, C.J. Toh, S.L. Shang, H.M.
Issue Date:	Nov-1998
Citation:	Tay, C.J., Toh, S.L., Shang, H.M. (1998-11). Time delay and integration imaging for internal profile inspection. Optics and Laser Technology 30 (8) : 459-465. ScholarBank@NUS Repository. https://doi.org/10.1016/S0030-3992(98)00078-4
Abstract:	A time delay and integration imaging technique is presented and applied to internal surface contour measurement. Using the proposed optical arrangement, inspection of profiles of objects which are mounted on the internal surface of a hollow cylinder can be carried out. Tests conducted on objects with diameters ranging from 40 to 214 mm show good agreement with results obtained from conventional profilometer.
Source Title:	Optics and Laser Technology
URI:	http://scholarbank.nus.edu.sg/handle/10635/58835
ISSN:	00303992
DOI:	10.1016/S0030-3992(98)00078-4
Appears in Collections:	Staff Publications

There are no files associated with this item.

Check