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Tay Cho Jui

rp08561

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Full Name
Tay Cho Jui
(not current staff)
Variants
Jui, T.C.
Cho, J.T.
Tay, C.-J.
Tay, C.
TAY, CHO JUI
Tay, C.J.
Jui Tay, C.
Tay C.J.
 
Main Affiliation
 
Faculty
 
Email
mpetaycj@nus.edu.sg
 

Publications

Results 1-20 of 189 (Search time: 0.005 seconds).

Issue DateTitleAuthor(s)
120043-D deformation measurement using fringe projection and digital image correlationQuan, C. ; Tay, C.J. ; Huang, Y.H.
21-Mar-2012A fast and accurate gamma correction based on Fourier spectrum analysis for digital fringe projection profilometryMa, S.; Quan, C. ; Zhu, R.; Chen, L.; Li, B.; Tay, C.J. 
32004A genetic optical interferometric inspection on micro-deformationWang, S.H. ; Quan, C. ; Tay, C.J. 
4Feb-1998A new method for generating and analysing digital speckle shearing correlation fringe patternsHe, Y.M.; Tay, C.J. ; Shang, H.M. 
515-Sep-2004A new method for phase extraction from a single fringe patternTay, C.J. ; Quan, C. ; Yang, F.J.; He, X.Y.
6Apr-2012A new S-shaped MEMS PZT cantilever for energy harvesting from low frequency vibrations below 30 HzLiu, H.; Lee, C. ; Kobayashi, T.; Tay, C.J. ; Quan, C. 
72003A parametric study on surface roughness evaluation of semi-conductor wafers by laser scatteringTay, C.J. ; Quan, C. 
8Dec-2011A scrape-through piezoelectric MEMS energy harvester with frequency broadband and up-conversion behaviorsLiu, H.; Tay, C.J. ; Quan, C. ; Kobayashi, T.; Lee, C. 
91994A simple model for sizing unbonds in foam-adhesive bonded laminates from shearographic fringesShang, H.M. ; Chau, F.S. ; Tay, C.J. ; Toh, S.L. ; Tham, L.M.
10Sep-2007A study on carrier-removal techniques in fringe projection profilometryQuan, C. ; Tay, C.J. ; Chen, L.J.
1125-Jan-2000AlxGa1-xAs semiconductor sensor for contact pressure measurementToh, S.-L. ; Tay, C.-J. ; Ng, S.-H.; Rahman, M. 
12Oct-1986An approximate solution for the hydrostatic bulging of circular diaphragms with draw-in allowedShang, H.M. ; Chau, F.S. ; Tay, C.J. ; Toh, S.L. 
13Feb-2010An improved windowed Fourier transform for fringe demodulationQuan, C. ; Niu, H.; Tay, C.J. 
14Apr-2005An optical shadowgraph microscope for a semiconductor wafer bump height measurementWang, S. ; Quan, C. ; Tay, C.J. 
15Feb-2007Analysis of phase distortion in phase-shifted fringe projectionMiao, H. ; Quan, C. ; Tay, C.J. ; Fu, Y. 
161-Sep-1993Analysis of shearogram reconstructionToh, S.L. ; Tay, C.J. ; Shang, H.M. ; Lin, Q.Y.
171-Apr-2006Application of an optical interferometer for measuring the surface contour of micro-componentsWang, S.H.; Tay, C.J. 
18Jul-2011Application of least-square estimation in white-light scanning interferometryMa, S.; Quan, C. ; Zhu, R.; Tay, C.J. ; Chen, L.; Gao, Z.
19Nov-1990Application of shearography in nondestructive testing of composite platesToh, S.L. ; Chau, F.S. ; Shim, V.P.W. ; Tay, C.J. ; Shang, H.M. 
201-Nov-2001Beam-splitting cube for fringe-projection, holographic, and shearographic interferometryShang, H.M. ; Hung, M.Y.Y. ; Quan, C.G. ; Tay, C.J.