Please use this identifier to cite or link to this item:
|Title:||A fast and accurate gamma correction based on Fourier spectrum analysis for digital fringe projection profilometry||Authors:||Ma, S.
|Keywords:||Digital fringe projection profilometry (DFPP)
Fourier spectrum analysis (FSA)
Spatial-carrier fringe patterns
|Issue Date:||1-Mar-2012||Citation:||Ma, S., Quan, C., Zhu, R., Chen, L., Li, B., Tay, C.J. (2012-03-01). A fast and accurate gamma correction based on Fourier spectrum analysis for digital fringe projection profilometry. Optics Communications 285 (5) : 533-538. ScholarBank@NUS Repository. https://doi.org/10.1016/j.optcom.2011.11.041||Abstract:||In digital fringe projection profilometry, the gamma effect of the used electronic devices seriously affects the accuracy of three-dimensional (3D) topography measurements. Previous gamma correction methods do not take full advantage of the Fourier spectrum of the captured spatial-carrier phase-shifting fringe patterns. Hence, dozens of phase-shifting fringe patterns are required to carry out gamma pre-calibration. In this paper, a fast and accurate gamma correction technique based on a Fourier spectrum analysis is proposed. Only two spatial-carrier fringe patterns with different pre-encoded gamma values are needed and the number of fringe patterns required for gamma pre-calibration is significantly reduced without loss of accuracy. The proposed method is validated by experiments. © 2011 Elsevier B.V. All rights reserved.||Source Title:||Optics Communications||URI:||http://scholarbank.nus.edu.sg/handle/10635/54126||ISSN:||00304018||DOI:||10.1016/j.optcom.2011.11.041|
|Appears in Collections:||Staff Publications|
Show full item record
Files in This Item:
There are no files associated with this item.
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.