Please use this identifier to cite or link to this item: https://doi.org/10.1016/j.optcom.2011.11.041
Title: A fast and accurate gamma correction based on Fourier spectrum analysis for digital fringe projection profilometry
Authors: Ma, S.
Quan, C. 
Zhu, R.
Chen, L.
Li, B.
Tay, C.J. 
Keywords: Digital fringe projection profilometry (DFPP)
Fourier spectrum analysis (FSA)
Gamma correction
Spatial-carrier fringe patterns
Issue Date: 1-Mar-2012
Citation: Ma, S., Quan, C., Zhu, R., Chen, L., Li, B., Tay, C.J. (2012-03-01). A fast and accurate gamma correction based on Fourier spectrum analysis for digital fringe projection profilometry. Optics Communications 285 (5) : 533-538. ScholarBank@NUS Repository. https://doi.org/10.1016/j.optcom.2011.11.041
Abstract: In digital fringe projection profilometry, the gamma effect of the used electronic devices seriously affects the accuracy of three-dimensional (3D) topography measurements. Previous gamma correction methods do not take full advantage of the Fourier spectrum of the captured spatial-carrier phase-shifting fringe patterns. Hence, dozens of phase-shifting fringe patterns are required to carry out gamma pre-calibration. In this paper, a fast and accurate gamma correction technique based on a Fourier spectrum analysis is proposed. Only two spatial-carrier fringe patterns with different pre-encoded gamma values are needed and the number of fringe patterns required for gamma pre-calibration is significantly reduced without loss of accuracy. The proposed method is validated by experiments. © 2011 Elsevier B.V. All rights reserved.
Source Title: Optics Communications
URI: http://scholarbank.nus.edu.sg/handle/10635/54126
ISSN: 00304018
DOI: 10.1016/j.optcom.2011.11.041
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