Please use this identifier to cite or link to this item:
Title: Wavelet analysis of speckle patterns with a temporal carrier
Authors: Fu, Y. 
Tay, C.J. 
Quan, C. 
Miao, H. 
Issue Date: 20-Feb-2005
Citation: Fu, Y., Tay, C.J., Quan, C., Miao, H. (2005-02-20). Wavelet analysis of speckle patterns with a temporal carrier. Applied Optics 44 (6) : 959-965. ScholarBank@NUS Repository.
Abstract: A novel temporal phase-analysis technique that is based on wavelet analysis and a temporal carrier is presented. To measure displacement on a vibrating object by using electronic speckle pattern interferometry, one captures a series of speckle patterns, using a high-speed CCD camera. To avoid ambiguity in phase estimation, a temporal carrier is generated by a piezoelectric transducer stage in the reference beam of the interferometer. The intensity variation of each pixel on recorded images is then analyzed along the time axis by a robust mathematical tool, i.e., a complex Morlet wavelet transform. After the temporal carrier is removed, the absolute displacement of a vibrating object is obtained without the need for temporal or spatial phase unwrapping. The results obtained by a wavelet transform are compared with those from a temporal Fourier transform. © 2005 Optical Society of America.
Source Title: Applied Optics
ISSN: 00036935
DOI: 10.1364/AO.44.000959
Appears in Collections:Staff Publications

Show full item record
Files in This Item:
There are no files associated with this item.


checked on Oct 19, 2020


checked on Oct 12, 2020

Page view(s)

checked on Oct 5, 2020

Google ScholarTM



Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.