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|Title:||Wavelet analysis of speckle patterns with a temporal carrier||Authors:||Fu, Y.
|Issue Date:||20-Feb-2005||Citation:||Fu, Y., Tay, C.J., Quan, C., Miao, H. (2005-02-20). Wavelet analysis of speckle patterns with a temporal carrier. Applied Optics 44 (6) : 959-965. ScholarBank@NUS Repository. https://doi.org/10.1364/AO.44.000959||Abstract:||A novel temporal phase-analysis technique that is based on wavelet analysis and a temporal carrier is presented. To measure displacement on a vibrating object by using electronic speckle pattern interferometry, one captures a series of speckle patterns, using a high-speed CCD camera. To avoid ambiguity in phase estimation, a temporal carrier is generated by a piezoelectric transducer stage in the reference beam of the interferometer. The intensity variation of each pixel on recorded images is then analyzed along the time axis by a robust mathematical tool, i.e., a complex Morlet wavelet transform. After the temporal carrier is removed, the absolute displacement of a vibrating object is obtained without the need for temporal or spatial phase unwrapping. The results obtained by a wavelet transform are compared with those from a temporal Fourier transform. © 2005 Optical Society of America.||Source Title:||Applied Optics||URI:||http://scholarbank.nus.edu.sg/handle/10635/61692||ISSN:||00036935||DOI:||10.1364/AO.44.000959|
|Appears in Collections:||Staff Publications|
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