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Quan, Chenggen

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Full Name
Quan, Chenggen
Variants
Chenggen, Q.
Quan, C.G.
Quan, C.
QUAN, CHENGGEN
 
Main Affiliation
 
Faculty
 

Publications

Results 101-120 of 215 (Search time: 0.005 seconds).

Issue DateTitleAuthor(s)
1012011Investigation of piezoelectric MEMS-based wideband energy harvesting system with assembled frequency-up-conversion mechanismLiu, H.; Lee, C. ; Kobayashi, T.; Tay, C.J. ; Quan, C. 
102May-2000Laser integrated measurement of surface roughness and micro-displacementWang, S.H. ; Tay, C.J. ; Quan, C. ; Shang, H.M. ; Zhou, Z.F.
10315-Jan-2006Lau phase interferometry with a vibrating objectQuan, C. ; Thakur, M. ; Tay, C.J. 
1042009Line end shortening and corner rounding for novel off-axis illumination source shapesLing, M.L.; Chua, G.S.; Lin, Q.; Tay, C.J. ; Quan, C. 
1052001Mask error enhancement factor for sub 0.13μm lithographyTan, S.K.; Lin, Q.; Quan, C. ; Tay, C.J. ; See, A. 
1061-Jan-2004Measurement of a fiber-end surface profile by use of phase-shifting laser interferometryWang, S. ; Quan, C. ; Tay, C.J. ; Reading, I.; Fang, Z.
10715-Apr-2004Measurement of a micro-solderball height using a laser projection methodTay, C.J. ; Wang, S.H. ; Quan, C. ; Lee, B.W.; Chan, K.C.
108Mar-2001Measurement of a microphone membrane deflection profile using an optical fibre and wedge fringe projectionTay, C.J. ; Quan, C. ; Wang, S.H. ; Shang, H.M. ; Chan, K.C.
1092001Measurement of angle of rotation using circular optical gratingShang, H.M. ; Toh, S.L. ; Fu, Y. ; Quan, C. ; Tay, C.J. 
11020-May-2008Measurement of curvature and twist of a deformed object using digital holographyChen, W. ; Quan, C. ; Tay, C.J. 
1112005Measurement of transparent coating thickness by the use of white light interferometryLi, M.; Quan, C. ; Tay, C.J. ; Reading, I.; Wang, S. 
1122002MEF studies for attenuated phase shift mask for sub 0.13 um technology using 248 nmTan, S.K.; Lin, Q.; Chua, G.S.; Quan, C. ; Tay, C.J. 
11328-May-2013Methods for enhancing photolithography patterningLING, MOH LUNG; CHUA, GEK SOON; LIN, QUNYING; TAY, CHO JUI ; QUAN, CHENGGEN 
11415-May-2011Micro-profile measurement based on windowed Fourier transform in white-light scanning interferometryMa, S.; Quan, C. ; Zhu, R.; Tay, C.J. ; Chen, L.; Gao, Z.
1152012Micro-profile measurement of a transparent coating using windowed Fourier transform in white-light vertical scanning interferometryMa, S.; Quan, C. ; Zhu, R.; Chen, L.
116Oct-2002Microscopic surface contouring by fringe projection methodQuan, C. ; Tay, C.J. ; He, X.Y.; Kang, X. ; Shang, H.M. 
1171999Modeling of the optical torsion micromirrorZhang, X.M.; Chau, F.S. ; Quan, C. ; Liu, A.Q.
118Feb-2004Modified Rayleigh criterion for 90 nm lithography technologies and belowChua, G.S.; Tay, C.J. ; Quan, C. ; Lin, Q.
11924-May-2010Motion detection using extended fractional Fourier transform and digital speckle photographyBhaduri, B. ; Tay, C.J. ; Quan, C. ; Sheppard, C.J.R. 
1202010Motion detection using speckle photography and extended fractional Fourier transformBhaduri, B. ; Tay, C.J. ; Quan, C.