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Gong Hao

rp01924

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Full Name
Gong Hao
Variants
Hao, G.
Gong, Hao
Gong, H.
HAO, GONG
GONG, HAO
Gong H.
 
Main Affiliation
 
Faculty
 
Email
msegongh@nus.edu.sg
 

Publications

Results 41-60 of 228 (Search time: 0.004 seconds).

Issue DateTitleAuthor(s)
411995Determination of charge distribution volume in electron irradiated insulators by scanning electron microscopeChen, H.; Gong, H. ; Ong, C.K. 
42Jun-2013Development of ZnO nanostructured films via sodium chloride solution and investigation of its growth mechanism and optical propertiesWee, R.Q.; Yang, W.F.; Zhou, T.J.; Chen, R.; Sun, H.D.; Wang, C.F.; Lee, A.Y.S.; Gong, H. 
431993Dielectric polarization relaxation measurement in α-SiO2 by means of a scanning electron microscope techniqueOh, K.H. ; Le Gressus, C.; Gong, H. ; Ong, C.K. ; Tan, B.T.G. ; Ding, X.Z.
4417-Feb-1997Discharging behaviour on insulator surfaces in vacuum: A scanning electron microscopy observationGong, H. ; Ong, C.K. 
452015Dopant chemical potential modulation on oxygen vacancies formation in In2O3: A comparative density functional studyYu, Zhi Gen; Sun, Jian; Sullivan Michael B.; Zhang, Yong-Wei; Gong, Hao ; Singh, David J.
4622-Feb-2005Dopant sources choice for formation of p-type ZnO: Phosphorus compound sourcesYu, Z.G.; Gong, H. ; Wu, P.
47Feb-2005Dynamic thermal degradation studies on amorphous carbon thin filmsLi, Y.Q.; Zhang, L.H.; Gong, H. 
4827-Oct-1997Dynamics aspects of the charging behaviour of polymers under focused electron beam irradiationOng, C.K. ; Song, Z.G.; Gong, H. 
491994Effect of conjugated bonds on the charging of insulating polymersGong, H. ; Chooi, K.M.; Ong, C.K. 
501999Effect of Cu contamination on electrical characteristics for PMOS transistorsTee, K.C.; Prasad, K.; Lee, C.S.; Gong, H. ; Chan, L.; See, A.K.
5125-Jun-2008Effect of ion bombardment on the synthesis of vertically aligned single-walled carbon nanotubes by plasma-enhanced chemical vapor depositionLuo, Z.; Lim, S.; You, Y.; Miao, J.; Gong, H. ; Zhang, J. ; Wang, S.; Lin, J.; Shen, Z.
52May-2000Effect of magnetic anisotropy distribution in longitudinal thin film mediaHee, C.H.; Wang, J.P.; Gong, H. ; Low, T.S. 
53Sep-2000Effect of orientation ratio on recording performance for longitudinal thin film mediaHee, C.H.; Wang, J.P.; Gong, H. ; Low, T.S. 
5415-Dec-2003Effects of aluminum on the properties of p-type Cu-Al-O transparent oxide semiconductor prepared by reactive co-sputteringOng, C.H.; Gong, H. 
551997Effects of constant current-stressing on reoxidized nitrided oxide (ONO) in flash memory devicesCha, C.L.; Chor, E.F. ; Gong, H. ; Zhang, A.Q.; Chan, L.; Xie, J.
5620-Oct-2001Effects of nominal intermediate layer on microstructure and magnetic property in CoCrPtTa/CrTi thin filmsJin, D.; Wang, J.P.; Gong, H. 
572008Effects of oxygen on low-temperature growth and band alignment of ZnO/GaN heterostructuresLiu, H.F.; Hu, G.X. ; Gong, H. ; Zang, K.Y.; Chua, S.J.
582007Effects of substrate on the structure and orientation of ZnO thin film grown by rf-magnetron sputteringLiu, H.F.; Chua, S.J.; Hu, G.X. ; Gong, H. ; Xiang, N. 
592000Effects of surface smoothness and deposition temperature of floating gates in flash memory devices to oxide/nitride/oxide interpoly dielectric breakdownCha, C.L.; Chor, E.F. ; Gong, H. ; Chan, L.
602015Effects of triethanolamine on the morphology and phase of chemically deposited tin sulfideDu M.; Yin X. ; Gong H.