Full Name
Weng Khuen Ho
Variants
Ho, W.-K.
Ho, Weng-Khuen
Khuen, Ho Weng
Ho, M.
Ho, Weng Khuen
Khuen Ho, W.
Ho, W.Y.
Khuen, H.W.
Ho, W.K.
 
 
 
Email
elehowk@nus.edu.sg
 

Publications

Refined By:
Department:  ELECTRICAL AND COMPUTER ENGINEERING
Type:  Conference Paper
Department:  DEAN'S OFFICE (COLLEGE OF DESIGN & ENG)

Results 1-12 of 12 (Search time: 0.004 seconds).

Issue DateTitleAuthor(s)
12000A benchtop plant for evaluation of flexible structure control methodologiesBin, L.; Ho, W.K. ; Lim, K.W. ; Sin, K.K. 
22007Clustering intelligent sensor nodes for distributed fault detection & diagnosisJoe, Y.Y.; Ho, W.K. ; Lim, K.W. ; Ding, Z.Q.; Zhang, J.B.; Ling, K.V.; Romagnoli, J.A.
32002Control and signal processing for photoresist processing in microlithographyTay, A. ; Ho, W.K. ; Lim, K.W. ; Loh, A.P. ; Tan, W.W. 
41999Control of an integrated bake/chill systemLoh, A.P. ; Huang, A. ; Tan, W.W. ; Lim, K.W. ; Ho, W.K. 
52000Diagnosability of faults using finite-state automaton modelXi, YunXia; Lim, Khiang-Wee ; Ho, Weng-Khuen ; Preisig, Heinz A.
62001Fault diagnosis using dynamic finite-state automaton modelsXi, Y.-X.; Lim, K.-W. ; Ho, W.-K. ; Preisig, H.A.
71999Fault-detection and diagnosis scheme by dynamic computation of finite-state automaton tablesRamkumar, K.B.; Druckenmueller, M.; Xi, Y.X.; Philips, P.; Presig, H.A.; Ho, W.K. ; Lim, K.W. 
81999Fault-detection and diagnosis scheme by dynamic computation of finite-state automaton tablesRamkumar, K.B.; Druckenmueller, M.; Xi, Y.X.; Philips, P.; Presig, H.A.; Ho, W.K. ; Lim, K.W. 
92005In-situ measurement & control of photoresist development in microlithographyKiew, C.M.; Tay, A. ; Ho, W.K. ; Lim, K.W. ; Zhou, Y.
10May-2004Integrated bake/chill module with in situ temperature measurement for photoresist processingTay, A. ; Ho, W.-K. ; Loh, A.-P. ; Lim, K.-W. ; Tan, W.-W. ; Schaper, C.D.
112006Robust real-time thin film thickness estimationKiew, C.M.; Tay, A. ; Ho, W.K. ; Lim, K.W. ; Lee, J.H.
122003Warpage Detection during Baking of Semiconductor substrate in MicrolithographyHo, W.K. ; Tay, A. ; Lim, K.W. ; Zhou, Y.; Yang, K.