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Weng Khuen Ho

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Full Name
Weng Khuen Ho
Variants
Ho, W.-K.
Ho, Weng-Khuen
Khuen, Ho Weng
Ho, M.
Ho, Weng Khuen
Khuen Ho, W.
Ho, W.Y.
Khuen, H.W.
Ho, W.K.
 
Main Affiliation
 
Faculty
 
Email
elehowk@nus.edu.sg
 

Publications

Refined By:
Department:  ELECTRICAL AND COMPUTER ENGINEERING
Department:  DEAN'S OFFICE (COLLEGE OF DESIGN & ENG)
Date Issued:  [2000 TO 2009]

Results 1-18 of 18 (Search time: 0.006 seconds).

Issue DateTitleAuthor(s)
12000A benchtop plant for evaluation of flexible structure control methodologiesBin, L.; Ho, W.K. ; Lim, K.W. ; Sin, K.K. 
22007Clustering intelligent sensor nodes for distributed fault detection & diagnosisJoe, Y.Y.; Ho, W.K. ; Lim, K.W. ; Ding, Z.Q.; Zhang, J.B.; Ling, K.V.; Romagnoli, J.A.
3Feb-2005Context-based recognition of process states using neural networksSrinivasan, R. ; Wang, C.; Ho, W.K. ; Lim, K.W. 
42002Control and signal processing for photoresist processing in microlithographyTay, A. ; Ho, W.K. ; Lim, K.W. ; Loh, A.P. ; Tan, W.W. 
52000Diagnosability of faults using finite-state automaton modelXi, YunXia; Lim, Khiang-Wee ; Ho, Weng-Khuen ; Preisig, Heinz A.
628-Apr-2004Dynamic Principal Component Analysis Based Methodology for Clustering Process States in Agile Chemical PlantsSrinivasan, R. ; Wang, C.; Ho, W.K. ; Lim, K.W. 
72001Fault diagnosis using dynamic finite-state automaton modelsXi, Y.-X.; Lim, K.-W. ; Ho, W.-K. ; Preisig, H.A.
82005In-situ measurement & control of photoresist development in microlithographyKiew, C.M.; Tay, A. ; Ho, W.K. ; Lim, K.W. ; Zhou, Y.
9May-2004Integrated bake/chill module with in situ temperature measurement for photoresist processingTay, A. ; Ho, W.-K. ; Loh, A.-P. ; Lim, K.-W. ; Tan, W.-W. ; Schaper, C.D.
10Nov-2004Intelligent alarm management in a petroleum refinerySrinivasan, R. ; Liu, J. ; Lim, K.W. ; Tan, K.C. ; Ho, W.K. 
1115-Apr-2005Neural network systems for multi-dimensional temporal pattern classificationSrinivasan, R. ; Wang, C.; Ho, W.K. ; Lim, K.W. 
1215-Apr-2005Neural network systems for multi-dimensional temporal pattern classificationSrinivasan, R. ; Wang, C.; Ho, W.K. ; Lim, K.W. 
132006Robust real-time thin film thickness estimationKiew, C.M.; Tay, A. ; Ho, W.K. ; Lim, K.W. ; Lee, J.H.
14Nov-2004Special report: Plant safety and environment: Intelligent alarm management in a petroleum refinerySrinivasan, R. ; Liu, J. ; Lim, K.W. ; Tan, K.C. ; Ho, W.K. 
15Nov-2004Special report: Plant safety and environment: Intelligent alarm management in a petroleum refinerySrinivasan, R. ; Liu, J. ; Lim, K.W. ; Tan, K.C. ; Ho, W.K. 
16Mar-2003The intelligent alarm management systemLiu, J. ; Lim, K.W. ; Ho, W.K. ; Tan, K.C. ; Srinivasan, R. ; Tay, A. 
17Mar-2003The intelligent alarm management systemLiu, J. ; Lim, K.W. ; Ho, W.K. ; Tan, K.C. ; Srinivasan, R. ; Tay, A. 
182003Warpage Detection during Baking of Semiconductor substrate in MicrolithographyHo, W.K. ; Tay, A. ; Lim, K.W. ; Zhou, Y.; Yang, K.