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Moorthi S/O Palaniapan

rp00101

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Full Name
Moorthi S/O Palaniapan
(not current staff)
Variants
Palaniappan, M.
Palaniapan, Moorthi
Palaniapan, M.
 
Main Affiliation
 
Faculty
 
Email
elemp@nus.edu.sg
 

Publications

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Type:  Conference Paper

Results 21-31 of 31 (Search time: 0.004 seconds).

Issue DateTitleAuthor(s)
212001New signal detection methods for thermal beam induced phenomenonPalaniappan, M. ; Chin, J.M.; Davis, B.; Bruce, M.; Wilcox, J.; Chua, C.M.; Koh, L.S.; Ng, H.Y.; Tan, S.H.; Phang, J.C.H. ; Gilfeather, G.
222007Non-destructive functionality and reliability assessment of dynamic MEMS using acoustic phonon characterizationWong, W.-K. ; Wong, C.-L.; Palaniapan, M. ; Tay, F.E.H. 
232006Non-invasive acoustic phonon characterization of dynamic MEMSWong, W.K. ; Palaniapan, M. ; Wong, C.L.; Wang, S.R.; Tay, F.E.H. 
242008Nonlinear behavior modeling of SOI micromechanical free-free beam resonatorsShao, L.; Palaniapan, M. 
252008Nonlinear behavior of Lamé-mode SOI bulk resonatorShao, L.C.; Palaniapan, M. ; Khine, L.; Tan, W.W. 
262008Nonlinear behavior of Lamé-mode SOI bulk resonatorShao, L.C.; Palaniapan, M. ; Khine, L.; Tan, W.W. 
27Sep-2003Single contact beam induced current phenomenon for microelectronic failure analysisPhang, J.C.H. ; Chan, D.S.H. ; Ong, V.K.S. ; Kolachina, S.; Chin, J.M.; Palaniappan, M. ; Gilfeather, G.; Seah, Y.X.
28Sep-2003Single contact beam induced current phenomenon for microelectronic failure analysisPhang, J.C.H. ; Chan, D.S.H. ; Ong, V.K.S. ; Kolachina, S.; Chin, J.M.; Palaniappan, M. ; Gilfeather, G.; Seah, Y.X.
291997Single phase two-switch buck type AC-DC converter topology with inductor voltage controlSrinivasan, Ramesh; Palaniapan, Moorthi ; Oruganti, Ramesh 
301997Single phase two-switch buck type AC-DC converter topology with inductor voltage controlSrinivasan, Ramesh; Palaniapan, Moorthi ; Oruganti, Ramesh 
311-Jun-2008The nonlinearity cancellation phenomenon in micromechanical resonatorsShao, L.C.; Palaniapan, M. ; Tan, W.W.