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Choi, W.K.

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Full Name
Choi, W.K.
Variants
Choi, W.-K.
Choi Wee Kion
Choi, Wee kiong
Choi, W.K
Choi, W.
Choi Wee Kiong
Choi, W.K.
 
Main Affiliation
 
Faculty
 
Email
elechoi@nus.edu.sg
 

Publications

Refined By:
Date Issued:  [2000 TO 2009]
Author:  Pey, K.L.
Type:  Conference Paper

Results 1-11 of 11 (Search time: 0.003 seconds).

Issue DateTitleAuthor(s)
12009Arrayed Si/SiGe nanowire heterostructure formation via Au-catalyzed wet chemical etching methodWang, X.; Pey, K.L.; Choi, W.K. ; Ho, C.K.F.; Fitzgerald, E.; Antoniadis, D.
22003Effect of current distribution on the reliability of multi-terminal Cu dual-damascene interconnect treesGan, C.L.; Thompson, C.V.; Pey, K.L.; Choi, W.K. ; Chang, C.W.; Guo, Q.
310-May-2006Electrical characterization of platinum and palladium effects in nickel monosilicide/n-Si Schottky contactsJin, L.J.; Pey, K.L.; Choi, W.K. ; Antoniadis, D.A.; Fitzgerald, E.A.; Chi, D.Z.
42002Experimental characterization of the reliability of 3-terminal dual-damascene copper interconnect treesGan, C.L.; Thompson, C.V.; Pey, K.L. ; Choi, W.K. ; Wei, F.; Yu, B.; Hau-Riege, S.P.
52003Experimental characterization of the reliability of multi-terminal dual-damascene copper interconnect treesGan, C.L.; Thompson, C.V.; Pey, K.L.; Choi, W.K. ; Chang, C.W.; Guo, Q.
62007Full range workfunction tunning of MOSFETs using interfacial yttrium layer in fully germanided Ni gateYu, H.P.; Pey, K.L.; Choi, W.K. ; Antoniadis, D.A.; Fitzgerald, E.A.; Dawood, M.K.; Ow, K.Q.; Chi, D.Z.
72002Length effects on the reliability of dual-damascene Cu interconnectsWei, F.; Gan, C.L.; Thompson, C.V.; Clement, J.J.; Hau-Riege, S.P.; Pey, K.L. ; Choi, W.K. ; Tay, H.L.; Yu, B.; Radhakrishnan, M.K.
82004Mortality dependence of Cu dual damascene interconnects on adjacent segmentChang, C.W.; Gan, C.L.; Thompson, C.V.; Pey, K.L.; Choi, W.K. ; Hwang, N.
92005Multi-via electromigration test structures for identification and characterization of different failure mechanismsChoi, Z.-S.; Chang, C.W.; Lee, J.H.; Gan, C.L.; Thompson, C.V.; Pey, K.L.; Choi, W.K. 
1020-Nov-2002Nickel silicidation on polycrystalline silicon germanium filmsChoi, W.K. ; Pey, K.L. ; Zhao, H.B.; Osipowicz, T. ; Shen, Z.X. 
112004Study of Ge out-diffusion during nickel (Platinum - 0, 5, 10 at.%) germanosilicide formationJin, L.J.; Pey, K.L.; Choi, W.K. ; Fitzgerald, E.A.; Antoniadis, D.A.; Pitera, A.J.; Lee, M.L.; Chi, D.Z.