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Wong Wai Kin

rp08362

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Full Name
Wong Wai Kin
(not current staff)
Variants
Wong, W.-K.
KIN, WONG WAI
Wong, W.K.
Wong, W.
 
Main Affiliation
 
Faculty
 
Email
elewwk@nus.edu.sg
 
Other emails
 

Publications

Refined By:
Author:  Phang, J.C.H.

Results 1-11 of 11 (Search time: 0.01 seconds).

Issue DateTitleAuthor(s)
1Oct-1997A novel method for the discharge of electrostatic mirror formations in the scanning electron microscopeWong, W.K. ; Phang, J.C.H. ; Thong, J.T.L. 
21995Charging control using pulsed scanning electron microscopyWong, W.K. ; Phang, J.C.H. ; Thong, J.T.L. 
31997Charging identification and compensation in the scanning electron microscopeWong, W.K. ; Thong, J.T.L. ; Phang, J.C.H. 
4Jul-2001Comparative Analysis of Scanning Electron Microscopy Techniques for Semiconductors: Electron-Beam-Induced Potential Method, Single-Contact Electron-Beam-Induced Current Method, and Thermoacoustic DetectionRau, E.I.; Gostev, A.V.; Shiqiu, Z.; Phang, D. ; Chan, D. ; Thong, D. ; Wong, W. 
51-Sep-1997Estimation of the second crossover in insulators using the electrostatic mirror in the scanning electron microscopeWong, W.K. ; Phang, J.C.H. ; Thong, J.T.L. 
6Jan-1998Factors governing the discharge of electrostatic mirror formations in the scanning electron microscopeWong, W.K. ; Thong, J.T.L. ; Phang, J.C.H. 
71995Imaging of charging specimens at high beam energies in the SEMWong, W.K. ; Phang, J.C.H. ; Thong, J.T.L. 
81995Imaging of charging specimens at high beam energies in the SEMWong, W.K. ; Phang, J.C.H. ; Thong, J.T.L. 
919-Aug-2003Selective deposition of a particle beam based on charging characteristics of a sampleKIN, WONG WAI ; PHANG, JACOB C. H. ; THONG, JOHN 
102001Specimen charging characterization using computer-based image contrast-emission processing for the scanning electron microscopeWong, W.K. ; Wei, Y.Z.; Phang, J.C.H. ; Thong, J.T.L. 
111995Study of integrated circuits I-V characteristics using a fault localization systems [FLS]Quah, L.T.S.; Wong, W.K. ; Phang, J.C.H. ; Chan, D.S.H. ; Ho, P.Y.S.