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|Title:||Visual observation and quantitative measurement of the microwave absorbing effect at X band||Authors:||Zhao, L.
|Issue Date:||2008||Citation:||Zhao, L., Chen, X., Ong, C.K. (2008). Visual observation and quantitative measurement of the microwave absorbing effect at X band. Review of Scientific Instruments 79 (12) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.3043414||Abstract:||We have set up a two-dimensional spatial field mapping system to measure graphically the quasi-free-space electromagnetic wave in a parallel plate waveguide. Our apparatus illustrates a potential application in characterizing the microwave absorbing materials. From the measured mappings of the microwave field, the visualization of spatial physical process and quantitative characterization of reflectivity coefficients can be achieved. This simple apparatus has a remarkable advantage over with conventional testing methods which usually involve huge, expensive anechoic chambers and demand samples of large size. © 2008 American Institute of Physics.||Source Title:||Review of Scientific Instruments||URI:||http://scholarbank.nus.edu.sg/handle/10635/98565||ISSN:||00346748||DOI:||10.1063/1.3043414|
|Appears in Collections:||Staff Publications|
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