Please use this identifier to cite or link to this item:
|Title:||Visual observation and quantitative measurement of the microwave absorbing effect at X band|
|Authors:||Zhao, L. |
|Citation:||Zhao, L., Chen, X., Ong, C.K. (2008). Visual observation and quantitative measurement of the microwave absorbing effect at X band. Review of Scientific Instruments 79 (12) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.3043414|
|Abstract:||We have set up a two-dimensional spatial field mapping system to measure graphically the quasi-free-space electromagnetic wave in a parallel plate waveguide. Our apparatus illustrates a potential application in characterizing the microwave absorbing materials. From the measured mappings of the microwave field, the visualization of spatial physical process and quantitative characterization of reflectivity coefficients can be achieved. This simple apparatus has a remarkable advantage over with conventional testing methods which usually involve huge, expensive anechoic chambers and demand samples of large size. © 2008 American Institute of Physics.|
|Source Title:||Review of Scientific Instruments|
|Appears in Collections:||Staff Publications|
Show full item record
Files in This Item:
There are no files associated with this item.
checked on Nov 14, 2018
WEB OF SCIENCETM
checked on Nov 6, 2018
checked on Nov 2, 2018
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.