Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.3043414
Title: Visual observation and quantitative measurement of the microwave absorbing effect at X band
Authors: Zhao, L. 
Chen, X.
Ong, C.K. 
Issue Date: 2008
Source: Zhao, L., Chen, X., Ong, C.K. (2008). Visual observation and quantitative measurement of the microwave absorbing effect at X band. Review of Scientific Instruments 79 (12) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.3043414
Abstract: We have set up a two-dimensional spatial field mapping system to measure graphically the quasi-free-space electromagnetic wave in a parallel plate waveguide. Our apparatus illustrates a potential application in characterizing the microwave absorbing materials. From the measured mappings of the microwave field, the visualization of spatial physical process and quantitative characterization of reflectivity coefficients can be achieved. This simple apparatus has a remarkable advantage over with conventional testing methods which usually involve huge, expensive anechoic chambers and demand samples of large size. © 2008 American Institute of Physics.
Source Title: Review of Scientific Instruments
URI: http://scholarbank.nus.edu.sg/handle/10635/98565
ISSN: 00346748
DOI: 10.1063/1.3043414
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