Please use this identifier to cite or link to this item: https://doi.org/10.1063/1.3043414
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dc.titleVisual observation and quantitative measurement of the microwave absorbing effect at X band
dc.contributor.authorZhao, L.
dc.contributor.authorChen, X.
dc.contributor.authorOng, C.K.
dc.date.accessioned2014-10-16T09:48:35Z
dc.date.available2014-10-16T09:48:35Z
dc.date.issued2008
dc.identifier.citationZhao, L., Chen, X., Ong, C.K. (2008). Visual observation and quantitative measurement of the microwave absorbing effect at X band. Review of Scientific Instruments 79 (12) : -. ScholarBank@NUS Repository. https://doi.org/10.1063/1.3043414
dc.identifier.issn00346748
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/98565
dc.description.abstractWe have set up a two-dimensional spatial field mapping system to measure graphically the quasi-free-space electromagnetic wave in a parallel plate waveguide. Our apparatus illustrates a potential application in characterizing the microwave absorbing materials. From the measured mappings of the microwave field, the visualization of spatial physical process and quantitative characterization of reflectivity coefficients can be achieved. This simple apparatus has a remarkable advantage over with conventional testing methods which usually involve huge, expensive anechoic chambers and demand samples of large size. © 2008 American Institute of Physics.
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1063/1.3043414
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentPHYSICS
dc.description.doi10.1063/1.3043414
dc.description.sourcetitleReview of Scientific Instruments
dc.description.volume79
dc.description.issue12
dc.description.page-
dc.description.codenRSINA
dc.identifier.isiut000262224800045
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