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|Title:||Using the scanning electron microscope to obtain unique grain orientations from crystallographic traces on a single surface||Authors:||Fong, H.S.
|Issue Date:||Jan-1990||Citation:||Fong, H.S., Lim, S.C., Lim, P.Y. (1990-01). Using the scanning electron microscope to obtain unique grain orientations from crystallographic traces on a single surface. Journal of Materials Science Letters 9 (1) : 43-45. ScholarBank@NUS Repository. https://doi.org/10.1007/BF00722864||Source Title:||Journal of Materials Science Letters||URI:||http://scholarbank.nus.edu.sg/handle/10635/58886||ISSN:||02618028||DOI:||10.1007/BF00722864|
|Appears in Collections:||Staff Publications|
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