Please use this identifier to cite or link to this item: https://doi.org/10.1007/BF00722864
Title: Using the scanning electron microscope to obtain unique grain orientations from crystallographic traces on a single surface
Authors: Fong, H.S. 
Lim, S.C. 
Lim, P.Y.
Issue Date: Jan-1990
Source: Fong, H.S., Lim, S.C., Lim, P.Y. (1990-01). Using the scanning electron microscope to obtain unique grain orientations from crystallographic traces on a single surface. Journal of Materials Science Letters 9 (1) : 43-45. ScholarBank@NUS Repository. https://doi.org/10.1007/BF00722864
Source Title: Journal of Materials Science Letters
URI: http://scholarbank.nus.edu.sg/handle/10635/58886
ISSN: 02618028
DOI: 10.1007/BF00722864
Appears in Collections:Staff Publications

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