Please use this identifier to cite or link to this item: https://doi.org/10.1007/BF00722864
DC FieldValue
dc.titleUsing the scanning electron microscope to obtain unique grain orientations from crystallographic traces on a single surface
dc.contributor.authorFong, H.S.
dc.contributor.authorLim, S.C.
dc.contributor.authorLim, P.Y.
dc.date.accessioned2014-06-17T05:19:29Z
dc.date.available2014-06-17T05:19:29Z
dc.date.issued1990-01
dc.identifier.citationFong, H.S., Lim, S.C., Lim, P.Y. (1990-01). Using the scanning electron microscope to obtain unique grain orientations from crystallographic traces on a single surface. Journal of Materials Science Letters 9 (1) : 43-45. ScholarBank@NUS Repository. https://doi.org/10.1007/BF00722864
dc.identifier.issn02618028
dc.identifier.urihttp://scholarbank.nus.edu.sg/handle/10635/58886
dc.description.urihttp://libproxy1.nus.edu.sg/login?url=http://dx.doi.org/10.1007/BF00722864
dc.sourceScopus
dc.typeArticle
dc.contributor.departmentMECHANICAL & PRODUCTION ENGINEERING
dc.description.doi10.1007/BF00722864
dc.description.sourcetitleJournal of Materials Science Letters
dc.description.volume9
dc.description.issue1
dc.description.page43-45
dc.description.codenJMSLD
dc.identifier.isiutA1990CK92200019
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