Please use this identifier to cite or link to this item: https://doi.org/10.4229/EUPVSEC20192019-2EO.1.5
Title: CHARACTERIZATION OF FIRE-THROUGH PASTES ON LPCVD BASED PASSIVATING CONTACTS IN monoPolyTM SOLAR CELLS
Authors: Padhamnath Pradeep 
Buatis, Kitz 
Nandakumar, Naomi 
Nampalli, Nitin 
Nagarajan, Balaji 
Shanmugam, Vinodh 
Aberle, Armin 
Duttagupta, Shubham 
Issue Date: 24-Oct-2019
Publisher: EU SPVSEC
Citation: Padhamnath Pradeep, Buatis, Kitz, Nandakumar, Naomi, Nampalli, Nitin, Nagarajan, Balaji, Shanmugam, Vinodh, Aberle, Armin, Duttagupta, Shubham (2019-10-24). CHARACTERIZATION OF FIRE-THROUGH PASTES ON LPCVD BASED PASSIVATING CONTACTS IN monoPolyTM SOLAR CELLS. 36th European Photovoltaic Solar Energy Conference and Exhibition 2EO.1.5 : 309-313. ScholarBank@NUS Repository. https://doi.org/10.4229/EUPVSEC20192019-2EO.1.5
Abstract: In this work, we have characterized screen-printed passivating contacts formed by different commercially available fire-through pastes on phosphorus-doped (n+) polysilicon (poly-Si) layers at the rear side of monoPolyTM solar cells. Extremely low recombination current density under metal contacts (J01,metal) of 35-45 fA/cm2 and excellent contact resistivity (ρc) values of ~1.3 mΩ-cm2 are obtained for two different thicknesses of poly-Si (150 nm and 250 nm) used in this work. We observe although the metal-induced recombination increases with reducing the thickness of the poly-Si layer, thinner poly-Si layers can lead to higher efficiencies on account of reduced parasitic absorption leading to higher short-circuit current. A champion efficiency of 22.6% having 5 busbars is reported for monoPolyTM cells with the best performing FT paste on large area (244.3 cm2) commercially available Czochralski grown Si wafers.
Source Title: 36th European Photovoltaic Solar Energy Conference and Exhibition
URI: https://scholarbank.nus.edu.sg/handle/10635/169467
DOI: 10.4229/EUPVSEC20192019-2EO.1.5
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