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Fah Fatt Gan

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Profile

Full Name
Fah Fatt Gan
Variants
Gan, F.F.
Gan, F.-F.
Gan, Fah Fatt
 
Main Affiliation
 
Faculty
 
Email
staganff@nus.edu.sg
 

Publications

Results 1-20 of 23 (Search time: 0.012 seconds).

Issue DateTitleAuthor(s)
1Dec-2002A conditional decision procedure for high yield processesKuralmani, V.; Xie, M. ; Goh, T.N. ; Gan, F.F. 
2Sep-1999Application of X̄ control chart with modified limits in process controlChang, T.C.; Gan, F.F. 
31996Average run lengths for cumulative sum control charts under linear trendGan, F.F. 
4Jul-1999Charting techniques for monitoring a random shock processChang, T.C.; Gan, F.F. 
51989Combined mean and variance control chartsGan, Fah Fatt 
62000Computing average run lengths of exponential EWMA chartsGan, F.F. ; Chang, T.C.
7Jul-2001Cumulative sum charts for high yield processesChang, T.C.; Gan, F.F. 
8Apr-1995Cumulative sum control chart for monitoring process varianceChang, T.C.; Gan, F.F. 
9Jan-2004Designs of moving average control chartWong, H.B.; Gan, F.F. ; Chang, T.C.
10Jan-1998Designs of one- and two-sided exponential EWMA chartsGan, F.F. 
11Jul-2001Detecting over rejection in testing of integrated circuitsChang, T.C.; Gan, F.F. 
12Aug-1990Goodness-of-fit tests based on P-P probability plotsGan, F.F. ; Koehler, K.J.
13Jun-2004Interval charting schemes for joint monitoring of process mean and varianceGan, F.F. ; Ting, K.W.; Chang, T.C.
14Dec-1997Joint monitoring of process mean and varianceGan, F.F. 
15Mar-2012Joint monitoring scheme for clinical failures and predisposed risksLoke, C.K.; Gan, F.F. 
16Sep-2007Modified shewhart charts for high yield processesChang, T.C.; Gan, F.F. 
171-Oct-2006Monitoring linearity of measurement gaugesChang, T.-C.; Gan, F.-F. 
18Jun-2005Outlier labeling with boxplot proceduresSim, C.H.; Gan, F.F. ; Chang, T.C.
19Dec-2012Phase I study of surgical performances with risk-adjusted Shewhart control chartsZhang, L.; Gan, F.F. ; Loke, C.K.
202012Risk-adjusted cumulative sum charting proceduresGan, F.F. ; Lin, L.; Loke, C.K.