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Title: Cumulative sum charts for high yield processes
Authors: Chang, T.C.
Gan, F.F. 
Keywords: Bernoulli counts
Geometric counts
Markov chain
Statistical process control
Issue Date: Jul-2001
Citation: Chang, T.C.,Gan, F.F. (2001-07). Cumulative sum charts for high yield processes. Statistica Sinica 11 (3) : 791-805. ScholarBank@NUS Repository.
Abstract: The cumulative sum (CUSUM) chart, well-known to be sensitive in detecting small and moderate parameter changes, is proposed here for monitoring a high yield process. The sensitivities of the CUSUM charts based on geometric, Bernoulli and binomial counts are compared. Based on the comparisons, recommendations for the selection of a chart are provided. Simple procedures are given for optimal design of CUSUM charts based on geometric and Bernoulli counts. An application of CUSUM charts in monitoring an actual high yield process is demonstrated.
Source Title: Statistica Sinica
ISSN: 10170405
Appears in Collections:Staff Publications

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