Please use this identifier to cite or link to this item: https://doi.org/10.1002/(SICI)1099-1638(199909/10)15:5<355::AID-QRE260>3.0.CO;2-9
Title: Application of X̄ control chart with modified limits in process control
Authors: Chang, T.C.
Gan, F.F. 
Issue Date: Sep-1999
Citation: Chang, T.C., Gan, F.F. (1999-09). Application of X̄ control chart with modified limits in process control. Quality and Reliability Engineering International 15 (5) : 355-362. ScholarBank@NUS Repository. https://doi.org/10.1002/(SICI)1099-1638(199909/10)15:5<355::AID-QRE260>3.0.CO;2-9
Abstract: The conventional Shewhart X̄ chart is developed based on the assumption that the within-sample variation is due to the inherent process variation, and any significant variation between samples is attributed to the existence of assignable causes. In the manufacturing industry there are processes where there is variation between samples due to the inherent process variation. A straightforward application of the conventional Shewhart X̄ chart would thus result in more frequent false alarms. The problems associated with various Shewhart X̄ charts in monitoring such a process are discussed using a real data set from an integrated circuit (IC) assembly process. A Shewhart X̄ chart with modified limits is adapted for such a process. In addition to the usual ability to signal for assignable causes, the X̄ chart with modified limits is also developed as a tool to signal the need for adjustment of controllable process variables for improving the process capability. Practical application of this chart in monitoring an IC assembly press is discussed.
Source Title: Quality and Reliability Engineering International
URI: http://scholarbank.nus.edu.sg/handle/10635/105006
ISSN: 07488017
DOI: 10.1002/(SICI)1099-1638(199909/10)15:5<355::AID-QRE260>3.0.CO;2-9
Appears in Collections:Staff Publications

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