Please use this identifier to cite or link to this item:
Title: Modified shewhart charts for high yield processes
Authors: Chang, T.C.
Gan, F.F. 
Keywords: Average run length
Binomial counts
Parts-per-million non-conforming items
Statistical process control
Supplementary runs rules
Issue Date: Sep-2007
Citation: Chang, T.C., Gan, F.F. (2007-09). Modified shewhart charts for high yield processes. Journal of Applied Statistics 34 (7) : 857-877. ScholarBank@NUS Repository.
Abstract: The conventional Shewhart p or np chart is not effective for monitoring a high yield process, a process in which the defect level is close to zero. An improved Shewhart np chart for monitoring high yield processes is proposed. A review of control charts for monitoring high yield processes is first given. The run length performance of the proposed Shewhart chart is then compared with other high yield control charts. A simple procedure for designing the chart for processes subjected to sampling or 100% continuous inspection is provided and this allows the chart to be implemented easily on the factory floor. The practical aspects of implementation of the Shewhart chart are discussed. An application of the Shewhart chart based on a real data set is demonstrated.
Source Title: Journal of Applied Statistics
ISSN: 02664763
DOI: 10.1080/02664760701546279
Appears in Collections:Staff Publications

Show full item record
Files in This Item:
There are no files associated with this item.

Google ScholarTM



Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.