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Phang, J.C.H.

rp08036

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Full Name
Phang, J.C.H.
Variants
Phang, Jacob C.H.
Phang, J.C.H.
PHANG, JACOB CHEE HONG
PHANG, J. C. H.
Phang, J.C.
Phang, J.Ch.
Phang, D.
PHANG, JACOB C. H.
Jch, P.
Phang, J.
 
Faculty
 
Email
elejpch@nus.edu.sg
 

Publications

Refined By:
Date Issued:  [2000 TO 3000]
Author:  Koh, L.S.
Department:  ELECTRICAL AND COMPUTER ENGINEERING

Results 1-8 of 8 (Search time: 0.004 seconds).

Issue DateTitleAuthor(s)
12007A near-infrared, continuous wavelength, in-lens spectroscopic photon emission microscope systemTan, S.L.; Toh, K.H.; Phang, J.C.H. ; Chan, D.S.H. ; Chua, C.M.; Koh, L.S.
22004A review of laser induced techniques for microelectronic failure analysisPhang, J.C.H. ; Chan, D.S.H. ; Palaniappan, M. ; Chin, J.M.; Davis, B.; Bruce, M.; Wilcox, J.; Gilfeather, G.; Chua, C.M.; Koh, L.S.; Ng, H.Y.; Tan, S.H.
32005A review of near infrared photon emission microscopy and spectroscopyPhang, J.C.H. ; Chan, D.S.H. ; Tan, S.L.; Len, W.B.; Yim, K.H.; Koh, L.S.; Chua, C.M.; Balk, L.J.
42006Detectivity optimization of ingaas photon emission microscope systemsTan, S.L.; Yim, K.H.; Chan, D.S.H. ; Phang, J.C.H. ; Zhou, Y.; Balk, L.J.; Chua, C.M.; Koh, L.S.
52007Determination of intrinsic spectra from frontside & backside photon emission spectroscopyTan, S.L.; Toh, K.H.; Chan, D.S.H. ; Phang, J.C.H. ; Chua, C.M.; Koh, L.S.
62008Near-infrared spectroscopic photon emission microscopy of 0.13 μm silicon nMOSFETs and pMOSFETsTan, S.L.; Teo, J.K.J.; Toh, K.H.; Isakov, D.; Chan, D.S.H. ; Koh, L.S.; Chua, C.M.; Phang, J.C.H. 
72007Near-IR photon emission spectroscopy on strained and unstrained 60 nm silicon nMOSFETsTan, S.L.; Ang, K.W.; Toh, K.H.; Isakov, D.; Chua, C.M.; Koh, L.S.; Yeo, Y.C. ; Chan, D.S.H. ; Phang, J.C.H. 
82001New signal detection methods for thermal beam induced phenomenonPalaniappan, M. ; Chin, J.M.; Davis, B.; Bruce, M.; Wilcox, J.; Chua, C.M.; Koh, L.S.; Ng, H.Y.; Tan, S.H.; Phang, J.C.H. ; Gilfeather, G.