Wang, Ling-Fai John

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Full Name

Wang, Ling-Fai John

Variants

Wang, L.F.
Wang, John L.F.
Wang, J.
Wang, J.L.F.

Main Affiliation

INSTITUTE OF MICROELECTRONICS

Faculty

NON-NUS ORGANISATIONS

Results 1-6 of 6 (Search time: 0.003 seconds).

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	Issue Date	Title	Author(s)
1	Oct-2009	Enhanced sensitivity of small-size (with 1-μm gate length) junction-field-effect-transistor-based germanium photodetector using two-step germanium epitaxy by ultrahigh vacuum chemical vapor deposition	Wang, J. ; Zang, H.; Yu, M.B.; Xiong, Y.Z.; Lo, G.Q.; Kwong, D.L.; Lee, S.J.
2	1997	FIB precision TEM sample preparation using carbon replica	Sheng, T.T. ; Goh, G.P.; Tung, C.H. ; Wang, John L.F. ; Cheng, Jeng Kou
3	Nov-2007	Impact of local strain from selective epitaxial germanium with thin Si/SiGe buffer on high-performance p-i-n photodetectors with a low thermal budget	Loh, W.Y.; Wang, J. ; Ye, J.D.; Yang, R.; Nguyen, H.S.; Chua, K.T.; Song, J.F.; Loh, T.H.; Xiong, Y.Z.; Lee, S.J. ; Yu, M.B.; Lo, G.Q.; Kwong, D.L.
4	May-1997	Precision transmission electron microscopy sample preparation using a focused ion beam by extraction method	Sheng, T.T. ; Goh, G.P.; Tung, C.H. ; Wang, L.F.
5	1999	Predicting plasma charging damage in ultra thin gate oxide by using nondestructive DCIV technique	Guan, Hao; Li, M.F. ; Zhang, Yaohui ; Cho, B.J. ; Jie, B.B.; Xie, Joseph; Wang, J.L.F. ; Yen, Andrew C. ; Sheng, George T.T.; Dong, Zhong; Li, Weidan
6	1999	Predicting plasma charging damage in ultra thin gate oxide by using nondestructive DCIV technique	Guan, Hao; Li, M.F. ; Zhang, Yaohui ; Cho, B.J. ; Jie, B.B.; Xie, Joseph; Wang, J.L.F. ; Yen, Andrew C. ; Sheng, George T.T.; Dong, Zhong; Li, Weidan