Yen, Chien-Chong Andrew

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Yen, Andrew C.

Main Affiliation

INSTITUTE OF MICROELECTRONICS

Faculty

NON-NUS ORGANISATIONS

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		Issue Date	Title	Author(s)
	1	1999	Predicting plasma charging damage in ultra thin gate oxide by using nondestructive DCIV technique	Guan, Hao; Li, M.F. ; Zhang, Yaohui ; Cho, B.J. ; Jie, B.B.; Xie, Joseph; Wang, J.L.F. ; Yen, Andrew C. ; Sheng, George T.T.; Dong, Zhong; Li, Weidan